Semi-supervised few-shot learning approach for plant diseases recognition
Background Learning from a few samples to automatically recognize the plant leaf diseases is an attractive and promising study to protect the agricultural yield and quality. The existing few-shot classification studies in agriculture are mainly based on supervised learning schemes, ignoring unlabele...
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Published in | Plant methods Vol. 17; no. 1; p. 68 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
London
BioMed Central
27.06.2021
BioMed Central Ltd BMC |
Subjects | |
Online Access | Get full text |
ISSN | 1746-4811 1746-4811 |
DOI | 10.1186/s13007-021-00770-1 |
Cover
Summary: | Background
Learning from a few samples to automatically recognize the plant leaf diseases is an attractive and promising study to protect the agricultural yield and quality. The existing few-shot classification studies in agriculture are mainly based on supervised learning schemes, ignoring unlabeled data's helpful information.
Methods
In this paper, we proposed a semi-supervised few-shot learning approach to solve the plant leaf diseases recognition. Specifically, the public PlantVillage dataset is used and split into the source domain and target domain. Extensive comparison experiments considering the domain split and few-shot parameters (N-way, k-shot) were carried out to validate the correctness and generalization of proposed semi-supervised few-shot methods. In terms of selecting pseudo-labeled samples in the semi-supervised process, we adopted the confidence interval to determine the number of unlabeled samples for pseudo-labelling adaptively.
Results
The average improvement by the single semi-supervised method is 2.8%, and that by the iterative semi-supervised method is 4.6%.
Conclusions
The proposed methods can outperform other related works with fewer labeled training data. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23 |
ISSN: | 1746-4811 1746-4811 |
DOI: | 10.1186/s13007-021-00770-1 |