Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity - Hart, James L.; Lang, Andrew C.; Leff, Asher C.; Longo, Paolo; Trevor, Colin; Twesten, Ray D.; Taheri, Mitra L. (Scientific reports, 2017)
Keywords: 639/301/930/12; 639/925/930/12; Electron microscopy; Energy; Humanities and Social Sciences; multidisciplinary; Science; Science (multidisciplinary); Sensors; Spectroscopy; Spectrum analysis; Trace elements