铜屏蔽层绕制方式对绝缘管母安全运行影响的研究
为了研究铜屏蔽层绕制方式对绝缘管母运行安全的影响,针对某地区110k V变电站35k V侧绝缘管母出现的外护套烧蚀击穿故障案例进行了研究。通过管母烧蚀击穿点的红外热成像,结合管母的有限元仿真对管母铜屏蔽层在绕包和叠包绕制方式下管母半导电层的电势分布、电流密度以及阻性损耗密度进行了对比分析。研究结果表明：两种绕制方式下管母的半导电层电势分布、电流密度及阻性损耗存在明显差异。管母采用绕包时在铜屏蔽层截断处容易形成局部高电势,半导电层表面电流及局部阻性发热功率密度大,半导电层发热严重并存在明显的过热点;采用叠包时管母半导电层的表面电势、电流密度及局部阻性发热功率接近于零,未发现明显的局部过热点。这些...
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| Published in | 电测与仪表 Vol. 54; no. 1; pp. 101 - 104 |
|---|---|
| Main Author | |
| Format | Journal Article |
| Language | Chinese |
| Published |
南方电网超高压输电公司梧州局,广西梧州,543002%四川大学电气信息学院,成都,610065
2017
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| Subjects | |
| Online Access | Get full text |
| ISSN | 1001-1390 |
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| Abstract | 为了研究铜屏蔽层绕制方式对绝缘管母运行安全的影响,针对某地区110k V变电站35k V侧绝缘管母出现的外护套烧蚀击穿故障案例进行了研究。通过管母烧蚀击穿点的红外热成像,结合管母的有限元仿真对管母铜屏蔽层在绕包和叠包绕制方式下管母半导电层的电势分布、电流密度以及阻性损耗密度进行了对比分析。研究结果表明：两种绕制方式下管母的半导电层电势分布、电流密度及阻性损耗存在明显差异。管母采用绕包时在铜屏蔽层截断处容易形成局部高电势,半导电层表面电流及局部阻性发热功率密度大,半导电层发热严重并存在明显的过热点;采用叠包时管母半导电层的表面电势、电流密度及局部阻性发热功率接近于零,未发现明显的局部过热点。这些特征可为改进管母铜屏蔽层的绕制方式和指导实际生产工作提供理论依据。 |
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| AbstractList | TM93; 为了研究铜屏蔽层绕制方式对绝缘管母运行安全的影响,针对某地区110kV变电站35kV侧绝缘管母出现的外护套烧蚀击穿故障案例进行了研究.通过管母烧蚀击穿点的红外热成像,结合管母的有限元仿真对管母铜屏蔽层在绕包和叠包绕制方式下管母半导电层的电势分布、电流密度以及阻性损耗密度进行了对比分析.研究结果表明:两种绕制方式下管母的半导电层电势分布、电流密度及阻性损耗存在明显差异.管母采用绕包时在铜屏蔽层截断处容易形成局部高电势,半导电层表面电流及局部阻性发热功率密度大,半导电层发热严重并存在明显的过热点;采用叠包时管母半导电层的表面电势、电流密度及局部阻性发热功率接近于零,未发现明显的局部过热点.这些特征可为改进管母铜屏蔽层的绕制方式和指导实际生产工作提供理论依据. 为了研究铜屏蔽层绕制方式对绝缘管母运行安全的影响,针对某地区110k V变电站35k V侧绝缘管母出现的外护套烧蚀击穿故障案例进行了研究。通过管母烧蚀击穿点的红外热成像,结合管母的有限元仿真对管母铜屏蔽层在绕包和叠包绕制方式下管母半导电层的电势分布、电流密度以及阻性损耗密度进行了对比分析。研究结果表明：两种绕制方式下管母的半导电层电势分布、电流密度及阻性损耗存在明显差异。管母采用绕包时在铜屏蔽层截断处容易形成局部高电势,半导电层表面电流及局部阻性发热功率密度大,半导电层发热严重并存在明显的过热点;采用叠包时管母半导电层的表面电势、电流密度及局部阻性发热功率接近于零,未发现明显的局部过热点。这些特征可为改进管母铜屏蔽层的绕制方式和指导实际生产工作提供理论依据。 |
| Abstract_FL | In order to investigate the influence of copper shield winding manner on the safety operation of pipe type In order to investigate the influence of copper shield winding manner on the safety operation of pipe typebusbar, this paper focused on 35kV AC sides of the busbar insulation burned down case in a 110kV substation.Accordingto the imaging of the breakdown point, the finite element simulation of the busbar was used to analyze the po -tential distribution of the semiconducting layer , current density and resistance loss density under copper shield wrapped and stacked way.The results show that the potential distribution , current density and resistance loss density are significantly different.The potential in the copper shield is high, and the current and resistance heating power density of semiconducting layer surface are large, there exist an obvious hot point when the copper shied is wrapped .The potential, surface current and resistance heating power density of the semiconducting layer are close to zero , and there is no obvious hot point when the copper shied is stacked .These features may improve the wingding way of the copper shield and provide a theoretical basis for the actual production work . |
| Author | 宋永佳 全杰雄 温才权 禤海贞 吴科 周凯 |
| AuthorAffiliation | 南方电网超高压输电公司梧州局,广西梧州543002 四川大学电气信息学院,成都610065 |
| AuthorAffiliation_xml | – name: 南方电网超高压输电公司梧州局,广西梧州,543002%四川大学电气信息学院,成都,610065 |
| Author_FL | Wen Caiquan Song Yongjia Wu Ke Zhou Kai Quan Jiexiong Xuan Haizhen |
| Author_FL_xml | – sequence: 1 fullname: Song Yongjia – sequence: 2 fullname: Quan Jiexiong – sequence: 3 fullname: Wen Caiquan – sequence: 4 fullname: Xuan Haizhen – sequence: 5 fullname: Wu Ke – sequence: 6 fullname: Zhou Kai |
| Author_xml | – sequence: 1 fullname: 宋永佳 全杰雄 温才权 禤海贞 吴科 周凯 |
| BookMark | eNotzU9LAkEcxvE5GKTWm-jQbWF-O-vO7LGkfyB08S4zO7Om1G7tErHXKChIFLSIKMhbXRQvgqj0asbZ3kULdnouH55vCRXCKFQFVASMwQLi4U1USpI2xsSjHhTR_m__XU-62WCpJ7dm_qwfpquXmV509Xhm5h9m8WpGw9W4o0eP-v4r--llwye9nOh-x7zdmc-B-Z5uoY2Anydq-3_LqH54UK8eW7XTo5PqXs3yK4xZwnOoL4gUAQNZYYr5grkYK3AwCQRU7MDhDjh2wKirOJWCCwlSeVISSpRHSBntrm9veBjwsNloR9dxmAcb0k9TYWOgGDCwHO6soX8Whc2rVk4v49YFj9OGSwFTlxGb_AGleWqB |
| ClassificationCodes | TM93 |
| ContentType | Journal Article |
| Copyright | Copyright © Wanfang Data Co. Ltd. All Rights Reserved. |
| Copyright_xml | – notice: Copyright © Wanfang Data Co. Ltd. All Rights Reserved. |
| DBID | 2RA 92L CQIGP W92 ~WA 2B. 4A8 92I 93N PSX TCJ |
| DatabaseName | 维普期刊资源整合服务平台 中文科技期刊数据库-CALIS站点 维普中文期刊数据库 中文科技期刊数据库-工程技术 中文科技期刊数据库- 镜像站点 Wanfang Data Journals - Hong Kong WANFANG Data Centre Wanfang Data Journals 万方数据期刊 - 香港版 China Online Journals (COJ) China Online Journals (COJ) |
| DatabaseTitleList | |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| DocumentTitleAlternate | Research on the influence of copper shield wingding manner on the safety operation of pipe type busbar |
| DocumentTitle_FL | Research on the influence of copper shield wingding manner on the safety operation of pipe type busbar |
| EndPage | 104 |
| ExternalDocumentID | dcyyb201701018 671076832 |
| GroupedDBID | -03 2B. 2C0 2RA 5XA 5XD 92H 92I 92L ACGFS ALMA_UNASSIGNED_HOLDINGS CCEZO CEKLB CQIGP CW9 TCJ TGT U1G U5M W92 ~WA 4A8 93N ABJNI ADMLS GROUPED_DOAJ PSX |
| ID | FETCH-LOGICAL-c588-b947cb3dbf81d58e8cb8600e1403fb152f4a4142f876ea7dbabd1de9dd373e933 |
| ISSN | 1001-1390 |
| IngestDate | Thu May 29 04:07:57 EDT 2025 Wed Feb 14 10:06:05 EST 2024 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 1 |
| Keywords | 绝缘管母 pipe type busbar resistance loss 变电站 copper shield substation semiconducting layer 半导电层 阻性损耗 铜屏蔽层 |
| Language | Chinese |
| LinkModel | OpenURL |
| MergedId | FETCHMERGED-LOGICAL-c588-b947cb3dbf81d58e8cb8600e1403fb152f4a4142f876ea7dbabd1de9dd373e933 |
| Notes | copper shield, pipe type busbar, substation, semiconducting layer, resistance loss Song Yongjia1 Quan , Jiexiong , Wen Caiquan1, Xuan Haizhen1 , Wu Ke2 , Zhou Kai2 （ 1. Wuzhou Office of CSG EHV Power Transmission Company, Wuzhou 543002, Guangxi, China. 2. School of Electrical Engineering and Information, Sichuan University, Chengdu 610065, China） 23-1202/TH In order to investigate the influence of copper shield winding manner on the safety operation of pipe type busbar, this paper focused on 35kV AC sides of the busbar insulation burned down case in a l l0kV substation. Ac- cording to the imaging of the breakdown point, the finite element simulation of the busbar was used to analyze the po- tential distribution of the semiconducting layer, current density and resistance loss density under copper shield wrapped and stacked way. The results show that the potential distribution, current density and resistance loss density are significantly different. The potential in the copper shield is high, and the current and r |
| PageCount | 4 |
| ParticipantIDs | wanfang_journals_dcyyb201701018 chongqing_primary_671076832 |
| PublicationCentury | 2000 |
| PublicationDate | 2017 |
| PublicationDateYYYYMMDD | 2017-01-01 |
| PublicationDate_xml | – year: 2017 text: 2017 |
| PublicationDecade | 2010 |
| PublicationTitle | 电测与仪表 |
| PublicationTitleAlternate | Electrical Measurement ＆ Instrumentation |
| PublicationTitle_FL | Electrical Measurement & Instrumentation |
| PublicationYear | 2017 |
| Publisher | 南方电网超高压输电公司梧州局,广西梧州,543002%四川大学电气信息学院,成都,610065 |
| Publisher_xml | – name: 南方电网超高压输电公司梧州局,广西梧州,543002%四川大学电气信息学院,成都,610065 |
| SSID | ssj0039791 ssib001129792 ssib051374602 ssib017479537 |
| Score | 2.086346 |
| Snippet | 为了研究铜屏蔽层绕制方式对绝缘管母运行安全的影响,针对某地区110k V变电站35k V侧绝缘管母出现的外护套烧蚀击穿故障案例进行了研究。通过管母烧蚀击穿点的红外热成像,结... TM93; 为了研究铜屏蔽层绕制方式对绝缘管母运行安全的影响,针对某地区110kV变电站35kV侧绝缘管母出现的外护套烧蚀击穿故障案例进行了研究.通过管母烧蚀击穿点的红外热成... |
| SourceID | wanfang chongqing |
| SourceType | Aggregation Database Publisher |
| StartPage | 101 |
| SubjectTerms | 半导电层 变电站 绝缘管母 铜屏蔽层 阻性损耗 |
| Title | 铜屏蔽层绕制方式对绝缘管母安全运行影响的研究 |
| URI | http://lib.cqvip.com/qk/92179X/201701/671076832.html https://d.wanfangdata.com.cn/periodical/dcyyb201701018 |
| Volume | 54 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVAON databaseName: DOAJ Directory of Open Access Journals issn: 1001-1390 databaseCode: DOA dateStart: 20140101 customDbUrl: isFulltext: true dateEnd: 99991231 titleUrlDefault: https://www.doaj.org/ omitProxy: true ssIdentifier: ssj0039791 providerName: Directory of Open Access Journals |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3Na9RAFA9lT3oQP7HWjx6c40o-JpmZY2Y3SxH0VKG3JbNJ2tPWj_bQHkVBwVKhVUQU7E0vLb0USlv8a9Kt_4XvvcnuZlHwA5bwdvLmze-9l8y8mWReHOeuH2Far5w3s0DkTZ6LopnmuFFX-Lln0qxw6WMTDx5Gc4_4_YVwYarRqL21tLpi7vXWf7uv5H-8CmXgV9wl-w-eHQmFAqDBv3AED8Pxr3zMEsVUwFSLJSHTHpMdlkimONPtYYnPEsG0ZirEEimZjlgSMRUxrYinRbVCFneoxDK3iWgxJZGIExZ7WAt4JEmGEknVJdASG9UdplwkgFNaPG0EAAQglCRQxUxyEugiSCQU4KnHx8QG-ENsDo5SswT-SiYTIjSL46qVePQS7hCRpkousidkAx3UWSqsEaoHXGg7zSQfs0RYEyABAdohZuKVNSkAGczAK3RakOqcqaS-emK3idKVTu22mRI1o480FIhReSQjQngAKdZk9BAVRoXgVIIWHNeyipCJwXOaNIp9FgsyOrAlQ9-7cP8QrdA9aLWQiF_4_VbIA0qSS_LBLPCrzlp_84o_bqMBJpxkfclRsr1KpIcXypgZ7KywRQQT4SWoyPgyQPX9FkTWrv2QRzU44ut3MGNw66OnTQE-0UvYodCrFqlsVOVVpp_MbZ711tYMugUzHeKOfQiXRW1dhGJ6iEjF-NF_6AWCR-4oRxw-l6ZVlSE4TJKytNxffAKhH-3E6xdpf7EWNM5fdC5Us73Z2N66l5yp9aXLzvlaDtArjv6x9anc3zzbPin3nw-O3pWvDk7fH5bHm-Xe4eDo8-D4w2B353Rvo9x9Xb78evb97dnOm_Jkv9zaGHx8MfiyPfh2cNWZ7yTzrblm9WGTZi-ELswoLnomyEwBk8VQ5rJnJMw7ckydWRgIqAueco_7BUQqeSoyk5rMy3KVQX8a5CoIrjmN_nI_v-7MZmmWSlwYDgyE4sZVIEDxnsl9YJaZmnZmRsboPrb5a7oRzCpEBEP5tHOnMk-36tWedSddcuOPHDPOOaTtquRNp7HydDW_BXH6irlNfvwJlLCscA |
| linkProvider | Directory of Open Access Journals |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=%E9%93%9C%E5%B1%8F%E8%94%BD%E5%B1%82%E7%BB%95%E5%88%B6%E6%96%B9%E5%BC%8F%E5%AF%B9%E7%BB%9D%E7%BC%98%E7%AE%A1%E6%AF%8D%E5%AE%89%E5%85%A8%E8%BF%90%E8%A1%8C%E5%BD%B1%E5%93%8D%E7%9A%84%E7%A0%94%E7%A9%B6&rft.jtitle=%E7%94%B5%E6%B5%8B%E4%B8%8E%E4%BB%AA%E8%A1%A8&rft.au=%E5%AE%8B%E6%B0%B8%E4%BD%B3&rft.au=%E5%85%A8%E6%9D%B0%E9%9B%84&rft.au=%E6%B8%A9%E6%89%8D%E6%9D%83&rft.au=%E7%A6%A4%E6%B5%B7%E8%B4%9E&rft.date=2017&rft.pub=%E5%8D%97%E6%96%B9%E7%94%B5%E7%BD%91%E8%B6%85%E9%AB%98%E5%8E%8B%E8%BE%93%E7%94%B5%E5%85%AC%E5%8F%B8%E6%A2%A7%E5%B7%9E%E5%B1%80%2C%E5%B9%BF%E8%A5%BF%E6%A2%A7%E5%B7%9E%2C543002%25%E5%9B%9B%E5%B7%9D%E5%A4%A7%E5%AD%A6%E7%94%B5%E6%B0%94%E4%BF%A1%E6%81%AF%E5%AD%A6%E9%99%A2%2C%E6%88%90%E9%83%BD%2C610065&rft.issn=1001-1390&rft.volume=54&rft.issue=1&rft.spage=101&rft.epage=117&rft.externalDocID=dcyyb201701018 |
| thumbnail_s | http://utb.summon.serialssolutions.com/2.0.0/image/custom?url=http%3A%2F%2Fimage.cqvip.com%2Fvip1000%2Fqk%2F92179X%2F92179X.jpg http://utb.summon.serialssolutions.com/2.0.0/image/custom?url=http%3A%2F%2Fwww.wanfangdata.com.cn%2Fimages%2FPeriodicalImages%2Fdcyyb%2Fdcyyb.jpg |