Improving EEG Forward Modeling Using High-Resolution Five-Layer BEM-FMM Head Models: Effect on Source Reconstruction Accuracy - Nuñez Ponasso, Guillermo; Wartman, William A.; McSweeney, Ryan C.; Lai, Peiyao; Haueisen, Jens; Maess, Burkhard; Knösche, Thomas R.; Weise, Konstantin; Noetscher, Gregory M.; Raij, Tommi; Makaroff, Sergey N. (Bioengineering (Basel), 2024)
Keywords: Accuracy; Analysis; Anisotropy; Boundary element method; boundary element method (BEM); brain imaging; Conductivity; Dipoles; EEG; EEG dipole reconstruction; EEG source analysis; Electric properties; Electroencephalography; electroencephalography (EEG); Errors; fast multipole method (FMM); Grid refinement (mathematics); High resolution; Human-computer interface; Inverse method; Inverse problems; Localization; Multipoles; Occipital lobe; Reconstruction; Substantia grisea; Young adults; EEG source analysis; brain imaging; electroencephalography (EEG); fast multipole method (FMM); adaptative mesh refinement (AMR); EEG dipole reconstruction; boundary element method (BEM)