于新, 张. 郭. 陆. (2015). NROM存储器总剂量辐射损伤效应和退火特性. 核技术, 38(1), 17-22. https://doi.org/10.11889/j.0253-3219.2015.hjs.38.010203
Chicago Style (17th ed.) Citation于新, 张兴尧 郭旗 陆妩. "NROM存储器总剂量辐射损伤效应和退火特性." 核技术 38, no. 1 (2015): 17-22. https://doi.org/10.11889/j.0253-3219.2015.hjs.38.010203.
MLA (9th ed.) Citation于新, 张兴尧 郭旗 陆妩. "NROM存储器总剂量辐射损伤效应和退火特性." 核技术, vol. 38, no. 1, 2015, pp. 17-22, https://doi.org/10.11889/j.0253-3219.2015.hjs.38.010203.
Warning: These citations may not always be 100% accurate.