Machine learning-driven design of wide-angle impedance matching structures for wide-angle scanning arrays - Hasibi Taheri, Sina; Mohammadpour, Javad; Lalbakhsh, Ali; Koziel, Slawomir; Szczepanski, Stanislaw (Scientific reports, 2025)
Keywords: 639/166; 639/166/987; Adaptability; Algorithms; Arrays; Decision tree (DT) models; Decision trees; Design; Generalized scattering matrix (GSM); Humanities and Social Sciences; Impedance; Learning algorithms; Machine learning; Machine learning (ML); multidisciplinary; Scanning; Science; Science (multidisciplinary); Wide-angle impedance matching (WAIM); Generalized scattering matrix (GSM); Machine learning (ML); Decision tree (DT) models; Wide-angle impedance matching (WAIM)