APA (7th ed.) Citation

Yoo, S., Yun, S., Jo, A., Cho, S., Cho, H., Lee, J., & Ahn, B. (2022). Automated measurement and analysis of sidewall roughness using three-dimensional atomic force microscopy. Applied microscopy, 52(1), 1-8. https://doi.org/10.1186/s42649-022-00070-5

Chicago Style (17th ed.) Citation

Yoo, Su-Been, Seong-Hun Yun, Ah-Jin Jo, Sang-Joon Cho, Haneol Cho, Jun-Ho Lee, and Byoung-Woon Ahn. "Automated Measurement and Analysis of Sidewall Roughness Using Three-dimensional Atomic Force Microscopy." Applied Microscopy 52, no. 1 (2022): 1-8. https://doi.org/10.1186/s42649-022-00070-5.

MLA (9th ed.) Citation

Yoo, Su-Been, et al. "Automated Measurement and Analysis of Sidewall Roughness Using Three-dimensional Atomic Force Microscopy." Applied Microscopy, vol. 52, no. 1, 2022, pp. 1-8, https://doi.org/10.1186/s42649-022-00070-5.