APA (7th ed.) Citation

Tan, D. Q. (2020). Differentiation of roughness and surface defect impact on dielectric strength of polymeric thin films. IET Nanodielectrics, 3(1), 28-31. https://doi.org/10.1049/iet-nde.2019.0031

Chicago Style (17th ed.) Citation

Tan, Daniel Qi. "Differentiation of Roughness and Surface Defect Impact on Dielectric Strength of Polymeric Thin Films." IET Nanodielectrics 3, no. 1 (2020): 28-31. https://doi.org/10.1049/iet-nde.2019.0031.

MLA (9th ed.) Citation

Tan, Daniel Qi. "Differentiation of Roughness and Surface Defect Impact on Dielectric Strength of Polymeric Thin Films." IET Nanodielectrics, vol. 3, no. 1, 2020, pp. 28-31, https://doi.org/10.1049/iet-nde.2019.0031.

Warning: These citations may not always be 100% accurate.