Improvement of the cross-entropy method in high dimension for failure probability estimation through a one-dimensional projection without gradient estimation

Rare event probability estimation is an important topic in reliability analysis. Stochastic methods, such as importance sampling, have been developed to estimate such probabilities but they often fail in high dimension. In this paper, we propose a new cross-entropy-based importance sampling algorith...

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Published inReliability engineering & system safety Vol. 216; p. 107991
Main Authors El Masri, Maxime, Morio, Jérôme, Simatos, Florian
Format Journal Article
LanguageEnglish
Published Barking Elsevier Ltd 01.12.2021
Elsevier BV
Elsevier
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Online AccessGet full text
ISSN0951-8320
1879-0836
1879-0836
DOI10.1016/j.ress.2021.107991

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Summary:Rare event probability estimation is an important topic in reliability analysis. Stochastic methods, such as importance sampling, have been developed to estimate such probabilities but they often fail in high dimension. In this paper, we propose a new cross-entropy-based importance sampling algorithm to improve rare event probability estimation in high dimension. We focus on the cross-entropy method with Gaussian auxiliary distributions and we suggest to update the Gaussian covariance matrix only in a one-dimensional subspace. For that purpose, the main idea is to consider the projection in the one-dimensional subspace spanned by the sample mean vector, which gives an influential direction for the variance estimation. This approach does not require any additional simulation budget compared to the basic cross-entropy algorithm and we show on different numerical test cases that it greatly improves its performance in high dimension. •We propose a Cross Entropy (CE) based algorithm for rare event estimation in high dimension.•We focus on the CE method with Gaussian auxiliary distributions, in unimodal problems.•The method relies on a projection in a one-dimensional subspace.•The proposed algorithm outperforms the basic CE algorithm in high dimensional examples.
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ISSN:0951-8320
1879-0836
1879-0836
DOI:10.1016/j.ress.2021.107991