A Stable Bayesian Vector Network Analyzer Calibration Algorithm - Hoffmann, J.; Leuchtmann, P.; Ruefenacht, J.; Vahldieck, R. (IEEE transactions on microwave theory and techniques, 2009)
Keywords: Algorithm design and analysis; Algorithms; Applied sciences; Bayesian methods; Calibration; Carbon nanotubes; Computer errors; Devices; Electronics; error analysis; Errors; estimation; Exact sciences and technology; Impedance; Instruments; Mathematical models; Measurement standards; Molecular electronics, nanoelectronics; Monte Carlo methods; Networks; Robustness; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Testing; vector network analyzer (VNA); Network analyzer; vector network analyzer (VNA); Error analysis; Error estimation; Carbon nanotubes; Implementation; Optimization; Nanoelectronics; Accuracy; Monte Carlo methods; Bayes network; Robustness; Monte Carlo method; Nanotube devices; Benchmarking; Transistor; Nonlinear problems; Calibration; Vector method; Algorithm; estimation; Statistical model; Numerical simulation; Bayes methods; High impedance