Characterization challenges for nanomaterials - Baer, D. R.; Amonette, J. E.; Engelhard, M. H.; Gaspar, D. J.; Karakoti, A. S.; Kuchibhatla, S.; Nachimuthu, P.; Nurmi, J. T.; Qiang, Y.; Sarathy, V.; Seal, S.; Sharma, A.; et al. (Surface and interface analysis, 2008)
Keywords: CERIUM OXIDES; characterization; CHEMICAL ANALYSIS; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Environmental Molecular Sciences Laboratory; Exact sciences and technology; GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE; IRON; IRON OXIDES; MEASURING METHODS; nanomaterials; NANOSCIENCE AND NANOTECHNOLOGY; NANOSTRUCTURES; PHYSICAL PROPERTIES; Physics; SPATIAL RESOLUTION; surface analysis; SURFACE PROPERTIES; TEM; XPS; XRD; Transmission electron microscopy; XPS; nanomaterials; XRD; Surface analysis; TEM; characterization; X-ray photoelectron spectra