Characterization and application of cerium fluoride film in infrared antireflection coating

Cerium fluoride (CeF 3) thin films were evaporated to the germanium substrates at different substrate temperature from 100 °C to 250 °C. Structural and optical properties were characterized by X-ray diffraction (XRD), scan electron microscopy (SEM) and Fourier transform infrared spectroscopy (FTIR)....

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Published inInfrared physics & technology Vol. 52; no. 5; pp. 204 - 207
Main Authors Su, Wei-tao, Li, Bin, Liu, Ding-quan, Zhang, Feng-shan
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.09.2009
Elsevier
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ISSN1350-4495
1879-0275
DOI10.1016/j.infrared.2009.07.008

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Summary:Cerium fluoride (CeF 3) thin films were evaporated to the germanium substrates at different substrate temperature from 100 °C to 250 °C. Structural and optical properties were characterized by X-ray diffraction (XRD), scan electron microscopy (SEM) and Fourier transform infrared spectroscopy (FTIR). The morphology of samples deposited at different temperature can be closely related to preferred orientation. The infrared optical constants were obtained by fitting the transmission spectrum using Lorentz oscillator model. A simple example for fabrication of long-wave infrared broadband antireflection coating was also presented.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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ISSN:1350-4495
1879-0275
DOI:10.1016/j.infrared.2009.07.008