Particle alignment reliability in single particle electron cryomicroscopy: a general approach - Vargas, J.; Otón, J.; Marabini, R.; Carazo, J. M.; Sorzano, C. O. S. (Scientific reports, 2016)
Keywords: 631/114/1564; 631/535/1258/1259; Electron microscopy; Humanities and Social Sciences; Image processing; Microscopy; multidisciplinary; Projected images; Science; Statistical analysis