APA (7th ed.) Citation

Zayed, S. M., Attiya, G., El-Sayed, A., Sayed, A., & Hemdan, E. E. (2023). An Efficient Fault Diagnosis Framework for Digital Twins Using Optimized Machine Learning Models in Smart Industrial Control Systems. International journal of computational intelligence systems, 16(1), 1-18. https://doi.org/10.1007/s44196-023-00241-6

Chicago Style (17th ed.) Citation

Zayed, Samar M., Gamal Attiya, Ayman El-Sayed, Amged Sayed, and Ezz El-Din Hemdan. "An Efficient Fault Diagnosis Framework for Digital Twins Using Optimized Machine Learning Models in Smart Industrial Control Systems." International Journal of Computational Intelligence Systems 16, no. 1 (2023): 1-18. https://doi.org/10.1007/s44196-023-00241-6.

MLA (9th ed.) Citation

Zayed, Samar M., et al. "An Efficient Fault Diagnosis Framework for Digital Twins Using Optimized Machine Learning Models in Smart Industrial Control Systems." International Journal of Computational Intelligence Systems, vol. 16, no. 1, 2023, pp. 1-18, https://doi.org/10.1007/s44196-023-00241-6.