Analysis of the Frequency Shift versus Force Gradient of a Dynamic AFM Quartz Tuning Fork Subject to Lennard-Jones Potential Force - Chang, Chia-Ou; Chang-Chien, Wen-Tien; Song, Jia-Po; Zhou, Chuang; Huang, Bo-Shiun (Sensors (Basel, Switzerland), 2019)
Keywords: atomic force microscopy; force gradient; frequency shift; Hamilton’s principle; Microscopes; Microscopy; Nanotechnology; quartz tuning fork; Sensors; United Kingdom--UK; United States--US; Taiwan; atomic force microscopy; Hamilton’s principle; frequency shift; quartz tuning fork; force gradient