Theory of higher harmonics imaging in tapping-mode atomic force microscopy

The periodic impact force induced by tip-sample contact in a tapping mode atomic force microscope （AFM） gives rise to the non-harmonic response of a micro-cantilever. These non-harmonic signals contain the full characteristics of tip-sample interaction. A complete theoretical model describing the dy...

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Published inChinese physics B Vol. 19; no. 5; pp. 213 - 218
Main Author 李渊 钱建强 李英姿
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.05.2010
Subjects
Atomic force microscopy
Contact
Dynamical systems
Higher harmonics
Imaging
Mathematical analysis
Mathematical models
Recording
动力学行为
原子力显微镜
微悬臂梁
接触时间
相互作用
轻敲模式
高次谐波
Online AccessGet full text
ISSN1674-1056
2058-3834
DOI10.1088/1674-1056/19/5/050701

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Abstract The periodic impact force induced by tip-sample contact in a tapping mode atomic force microscope （AFM） gives rise to the non-harmonic response of a micro-cantilever. These non-harmonic signals contain the full characteristics of tip-sample interaction. A complete theoretical model describing the dynamical behaviour of tip-sample system was developed in this paper. An analytic formula was introduced to describe the relationship between time-varying tip-sample impact force and tip motion. The theoretical analysis and numerical results both show that the timevarying tip-sample impact force can be reconstructed by recording tip motion. This allows for the reconstruction of the characteristics of the tip-sample force, like contact time and maximum contact force. It can also explain the ability of AFM higher harmonics imaging in mapping stiffness and surface energy variations.
AbstractList The periodic impact force induced by tip-sample contact in a tapping mode atomic force microscope （AFM） gives rise to the non-harmonic response of a micro-cantilever. These non-harmonic signals contain the full characteristics of tip-sample interaction. A complete theoretical model describing the dynamical behaviour of tip-sample system was developed in this paper. An analytic formula was introduced to describe the relationship between time-varying tip-sample impact force and tip motion. The theoretical analysis and numerical results both show that the timevarying tip-sample impact force can be reconstructed by recording tip motion. This allows for the reconstruction of the characteristics of the tip-sample force, like contact time and maximum contact force. It can also explain the ability of AFM higher harmonics imaging in mapping stiffness and surface energy variations.
The periodic impact force induced by tip-sample contact in a tapping mode atomic force microscope (AFM) gives rise to the non-harmonic response of a micro-cantilever. These non-harmonic signals contain the full characteristics of tip-sample interaction. A complete theoretical model describing the dynamical behaviour of tip--sample system was developed in this paper. An analytic formula was introduced to describe the relationship between time-varying tip--sample impact force and tip motion. The theoretical analysis and numerical results both show that the time-varying tip--sample impact force can be reconstructed by recording tip motion. This allows for the reconstruction of the characteristics of the tip--sample force, like contact time and maximum contact force. It can also explain the ability of AFM higher harmonics imaging in mapping stiffness and surface energy variations.
Author 李渊 钱建强 李英姿
AuthorAffiliation Department of Applied Physics, Beihang University, Beijing 100191, China
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Snippet The periodic impact force induced by tip-sample contact in a tapping mode atomic force microscope （AFM） gives rise to the non-harmonic response of a...
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SubjectTerms Atomic force microscopy
Contact
Dynamical systems
Higher harmonics
Imaging
Mathematical analysis
Mathematical models
Recording
动力学行为
原子力显微镜
微悬臂梁
接触时间
相互作用
轻敲模式
高次谐波
Title Theory of higher harmonics imaging in tapping-mode atomic force microscopy
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