A Natural Visible and Infrared Facial Expression Database for Expression Recognition and Emotion Inference

To date, most facial expression analysis has been based on visible and posed expression databases. Visible images, however, are easily affected by illumination variations, while posed expressions differ in appearance and timing from natural ones. In this paper, we propose and establish a natural vis...

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Published inIEEE transactions on multimedia Vol. 12; no. 7; pp. 682 - 691
Main Authors Wang, Shangfei, Liu, Zhilei, Lv, Siliang, Lv, Yanpeng, Wu, Guobing, Peng, Peng, Chen, Fei, Wang, Xufa
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.11.2010
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Online AccessGet full text
ISSN1520-9210
1941-0077
DOI10.1109/TMM.2010.2060716

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Abstract To date, most facial expression analysis has been based on visible and posed expression databases. Visible images, however, are easily affected by illumination variations, while posed expressions differ in appearance and timing from natural ones. In this paper, we propose and establish a natural visible and infrared facial expression database, which contains both spontaneous and posed expressions of more than 100 subjects, recorded simultaneously by a visible and an infrared thermal camera, with illumination provided from three different directions. The posed database includes the apex expressional images with and without glasses. As an elementary assessment of the usability of our spontaneous database for expression recognition and emotion inference, we conduct visible facial expression recognition using four typical methods, including the eigenface approach [principle component analysis (PCA)], the fisherface approach [PCA + linear discriminant analysis (LDA)], the Active Appearance Model (AAM), and the AAM-based + LDA. We also use PCA and PCA+LDA to recognize expressions from infrared thermal images. In addition, we analyze the relationship between facial temperature and emotion through statistical analysis. Our database is available for research purposes.
AbstractList To date, most facial expression analysis has been based on visible and posed expression databases. Visible images, however, are easily affected by illumination variations, while posed expressions differ in appearance and timing from natural ones. In this paper, we propose and establish a natural visible and infrared facial expression database, which contains both spontaneous and posed expressions of more than 100 subjects, recorded simultaneously by a visible and an infrared thermal camera, with illumination provided from three different directions. The posed database includes the apex expressional images with and without glasses. As an elementary assessment of the usability of our spontaneous database for expression recognition and emotion inference, we conduct visible facial expression recognition using four typical methods, including the eigenface approach [principle component analysis (PCA)], the fisherface approach [PCA + linear discriminant analysis (LDA)], the Active Appearance Model (AAM), and the AAM-based + LDA. We also use PCA and PCA+LDA to recognize expressions from infrared thermal images. In addition, we analyze the relationship between facial temperature and emotion through statistical analysis. Our database is available for research purposes.
Author Zhilei Liu
Siliang Lv
Peng Peng
Fei Chen
Shangfei Wang
Xufa Wang
Guobing Wu
Yanpeng Lv
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Cites_doi 10.1002/ima.20059
10.1007/978-3-642-04208-9_38
10.1145/1462055.1462061
10.1088/0967-3334/30/4/N01
10.1109/AMFG.2003.1240838
10.1109/AFGR.2004.1301585
10.1109/CVPR.1991.139758
10.1109/TPAMI.2005.90
10.1109/34.927467
10.1109/TPAMI.2008.52
10.1145/1152934.1152939
10.1016/S0031-3203(02)00052-3
10.1109/ICSMC.2000.886027
10.1109/IEMBS.2007.4352270
10.1016/S0921-8890(99)00104-9
10.1109/34.598228
10.1037/0012-1649.40.5.776
10.1109/CVPR.2005.297
10.1023/A:1024498629430
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Issue 7
Keywords Infrared camera
Model matching
Image matching
Facies
visible image
Database
Illumination
Visible spectrum
expression recognition
Multimedia
Infrared thermography
Computer vision
Discriminant analysis
Statistical analysis
Face recognition
Inference
Emotion emotionality
Timed system
Emotion inference
infrared image
Luminance
spontaneous database
Thermal imaging
Usability
Facial expression
Principal component analysis
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References ref13
chung (ref32) 2000
ref12
ref15
(ref20) 0
ref14
ref30
ref11
ref2
shan (ref25) 2003
ref1
(ref16) 0
nhan (ref27) 2009; 30
douglas-cowie (ref10) 2003
krzywicki (ref5) 2009; 7343
rottenberg (ref22) 2007
ref24
ref23
ref26
pantic (ref7) 2007
(ref6) 0
ref28
(ref19) 0
(ref17) 0
ref29
ref8
(ref18) 2008
ref9
ref4
ref3
jenkins (ref31) 2009; 3
(ref21) 0
References_xml – ident: ref15
  doi: 10.1002/ima.20059
– volume: 7343
  start-page: 1
  year: 2009
  ident: ref5
  article-title: Analysis of facial thermal variations in response to emotion-eliciting film clips
  publication-title: Proc SPIEInt Soc Optical Engineering
– volume: 3
  start-page: 53
  year: 2009
  ident: ref31
  article-title: comparing thermographic, eeg, and subjective measures of affective experience during simulated product interactions
  publication-title: International J Design
– ident: ref13
  doi: 10.1007/978-3-642-04208-9_38
– ident: ref3
  doi: 10.1145/1462055.1462061
– volume: 30
  start-page: 23n
  year: 2009
  ident: ref27
  article-title: infrared thermal imaging as a physiological access pathway: a study of the baseline characteristics of facial skin temperatures
  publication-title: Physiol Measure
  doi: 10.1088/0967-3334/30/4/N01
– start-page: 157
  year: 2003
  ident: ref25
  article-title: illumination normalization for robust face recognition against varying lighting conditions
  publication-title: Proc IEEE Int Workshop Analysis and Modeling of Faces and Gestures
  doi: 10.1109/AMFG.2003.1240838
– ident: ref9
  doi: 10.1109/AFGR.2004.1301585
– year: 2000
  ident: ref32
  publication-title: Lexpression et la perception de l emotion extraite de la parole spontanee Evidences du coreen et de l'anglais
– year: 0
  ident: ref21
– year: 0
  ident: ref20
– ident: ref23
  doi: 10.1109/CVPR.1991.139758
– year: 0
  ident: ref6
– ident: ref8
  doi: 10.1109/TPAMI.2005.90
– ident: ref26
  doi: 10.1109/34.927467
– year: 0
  ident: ref19
– year: 2007
  ident: ref22
  publication-title: Handbook of Emotion Elicitation and Assessment
– ident: ref1
  doi: 10.1109/TPAMI.2008.52
– ident: ref4
  doi: 10.1145/1152934.1152939
– ident: ref2
  doi: 10.1016/S0031-3203(02)00052-3
– start-page: 2877
  year: 2003
  ident: ref10
  article-title: the description of naturally occurring emotional speech
  publication-title: Proc 15th Int Conf Phonetic Sciences
– year: 2008
  ident: ref18
  publication-title: D5i Final Report on WP5 IST FP6 Contract no 507422
– start-page: 377
  year: 2007
  ident: ref7
  publication-title: Machine Analysis of Facial Expressions in Face Recognition
– ident: ref28
  doi: 10.1109/ICSMC.2000.886027
– ident: ref30
  doi: 10.1109/IEMBS.2007.4352270
– ident: ref29
  doi: 10.1016/S0921-8890(99)00104-9
– ident: ref24
  doi: 10.1109/34.598228
– ident: ref11
  doi: 10.1037/0012-1649.40.5.776
– ident: ref12
  doi: 10.1109/CVPR.2005.297
– year: 0
  ident: ref16
– year: 0
  ident: ref17
– ident: ref14
  doi: 10.1023/A:1024498629430
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Snippet To date, most facial expression analysis has been based on visible and posed expression databases. Visible images, however, are easily affected by illumination...
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SubjectTerms Active appearance model
Applied sciences
Artificial intelligence
Cameras
Computer science; control theory; systems
Computer systems and distributed systems. User interface
Discriminant analysis
Emotion inference
Emotion recognition
Emotions
Exact sciences and technology
expression recognition
Face recognition
Facial
facial expression
Illumination
Image databases
Image sequences
Inference
Infrared
infrared image
Lighting
Linear discriminant analysis
Pattern recognition. Digital image processing. Computational geometry
Principal component analysis
Recognition
Software
Spontaneous
spontaneous database
Studies
Timing
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Title A Natural Visible and Infrared Facial Expression Database for Expression Recognition and Emotion Inference
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https://www.proquest.com/docview/831162819
Volume 12
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