Exploring Blob Detection to Determine Atomic Column Positions and Intensities in Time-Resolved TEM Images with Ultra-Low Signal-to-Noise - Manzorro, Ramon; Xu, Yuchen; Vincent, Joshua L.; Rivera, Roberto; Matteson, David S.; Crozier, Peter A. (Microscopy and microanalysis, 2022)
Keywords: Algorithms; Catalysis; Columns (structural); Computer vision; Image analysis; Microscopy; Nanoparticles; Object recognition; Signal processing; Signal to noise ratio; Software and Instrumentation; Temporal resolution; Transmission electron microscopy; tracking algorithm; nanoparticles; blob detection; transmission electron microscopy; noisy; atomic columns; time-resolved TEM