Advances in modeling semiconductor epitaxy: Contributions of growth orientation and surface reconstruction to InN metalorganic vapor phase epitaxy

We propose a newly improved thermodynamic analysis method that incorporates surface energies. The new theoretical approach enables us to investigate the effects of the growth orientation and surface reconstruction. The obtained knowledge would be indispensable for examining the preferred growth cond...

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Published inApplied physics express Vol. 9; no. 12; pp. 125601 - 125604
Main Authors Kusaba, Akira, Kangawa, Yoshihiro, Kempisty, Pawel, Shiraishi, Kenji, Kakimoto, Koichi, Koukitu, Akinori
Format Journal Article
LanguageEnglish
Japanese
Published The Japan Society of Applied Physics 01.12.2016
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ISSN1882-0778
1882-0786
DOI10.7567/APEX.9.125601

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Abstract We propose a newly improved thermodynamic analysis method that incorporates surface energies. The new theoretical approach enables us to investigate the effects of the growth orientation and surface reconstruction. The obtained knowledge would be indispensable for examining the preferred growth conditions in terms of the contribution of the surface state. We applied the theoretical approach to study the growth processes of InN(0001) and by metalorganic vapor phase epitaxy. Calculation results reproduced the difference in optimum growth temperature. That is, we successfully developed a new theoretical approach that can predict growth processes on various growth surfaces.
AbstractList We propose a newly improved thermodynamic analysis method that incorporates surface energies. The new theoretical approach enables us to investigate the effects of the growth orientation and surface reconstruction. The obtained knowledge would be indispensable for examining the preferred growth conditions in terms of the contribution of the surface state. We applied the theoretical approach to study the growth processes of InN(0001) and by metalorganic vapor phase epitaxy. Calculation results reproduced the difference in optimum growth temperature. That is, we successfully developed a new theoretical approach that can predict growth processes on various growth surfaces.
We propose a newly improved thermodynamic analysis method that incorporates surface energies. The new theoretical approach enables us to investigate the effects of the growth orientation and surface reconstruction. The obtained knowledge would be indispensable for examining the preferred growth conditions in terms of the contribution of the surface state. We applied the theoretical approach to study the growth processes of InN(0001) and by metalorganic vapor phase epitaxy. Calculation results reproduced the difference in optimum growth temperature. That is, we successfully developed a new theoretical approach that can predict growth processes on various growth surfaces.
Author Kakimoto, Koichi
Kusaba, Akira
Kangawa, Yoshihiro
Kempisty, Pawel
Koukitu, Akinori
Shiraishi, Kenji
Author_xml – sequence: 1
  givenname: Akira
  surname: Kusaba
  fullname: Kusaba, Akira
  email: akira.kusaba@kyudai.jp
  organization: Kyushu University Department of Aeronautics and Astronautics, Fukuoka 819-0395, Japan
– sequence: 2
  givenname: Yoshihiro
  surname: Kangawa
  fullname: Kangawa, Yoshihiro
  organization: Nagoya University Institute of Materials and Systems for Sustainability, Nagoya 464-8603, Japan
– sequence: 3
  givenname: Pawel
  surname: Kempisty
  fullname: Kempisty, Pawel
  organization: Polish Academy of Sciences Institute of High Pressure Physics, Sokolowska 29/37, 01-142 Warsaw, Poland
– sequence: 4
  givenname: Kenji
  surname: Shiraishi
  fullname: Shiraishi, Kenji
  organization: Nagoya University Institute of Materials and Systems for Sustainability, Nagoya 464-8603, Japan
– sequence: 5
  givenname: Koichi
  surname: Kakimoto
  fullname: Kakimoto, Koichi
  organization: Kyushu University Research Institute for Applied Mechanics, Kasuga, Fukuoka 816-8580, Japan
– sequence: 6
  givenname: Akinori
  surname: Koukitu
  fullname: Koukitu, Akinori
  organization: Tokyo University of Agriculture and Technology Department of Applied Chemistry, Koganei, Tokyo 184-8588, Japan
BookMark eNp1kE9PAjEQxRuDiYAevfeoh8Xt_mm73ghBJSHqgYO3zdB2oQTaTVsQvoaf2F1BD0ZPM5n5zXuZ10MdY41C6JrEA5ZTdjd8Hb8NigFJchqTM9QlnCdRzDjt_PSMX6Ce96s4pllKaBd9DOUOjFAea4M3Vqq1Ngvs1UYLa-RWBOuwqnWA_eEej6wJTs-3QVvjsa3wwtn3sMTWaWUCtGMMRmK_dRUIhZ1qRHxwjUy7ChZPzDPeqABr6xZgtMA7qBuHeglefftcovMK1l5dnWofzR7Gs9FTNH15nIyG00hkJAuR4ixhfM5zlqRMioSRRGaVzGlSUJDFHGgiIBOUARWZyop0zkjKeJxzEFSqtI-io6xw1nunqrJ2egPuUJK4bPMs2zzLojzm2fDpL17o48_BgV7_e3V7vNK2Lld260zz0r_szR8s1Gr_xZywspZV-gnMO5pl
CODEN APEPC4
CitedBy_id crossref_primary_10_35848_1347_4065_aba0d5
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ContentType Journal Article
Copyright 2016 The Japan Society of Applied Physics
Copyright_xml – notice: 2016 The Japan Society of Applied Physics
DBID AAYXX
CITATION
DOI 10.7567/APEX.9.125601
DatabaseName CrossRef
DatabaseTitle CrossRef
DatabaseTitleList
CrossRef
DeliveryMethod fulltext_linktorsrc
Discipline Physics
EISSN 1882-0786
ExternalDocumentID 10_7567_APEX_9_125601
AP160938
GroupedDBID -~X
23M
4.4
5GY
6OB
AAGCD
AAGID
AAJIO
AALHV
AATNI
ABCXL
ABHWH
ABJNI
ABVAM
ACGFS
ACHIP
ACNCT
ADIYS
ADWVK
AEFHF
AENEX
AFYNE
AKPSB
ALMA_UNASSIGNED_HOLDINGS
AOAED
ASPBG
ATQHT
AVWKF
AZFZN
B.R
CEBXE
CJUJL
CRLBU
CS3
EBS
EJD
IIPPG
IJHAN
IOP
IZVLO
KOT
MC8
N5L
P2P
PJBAE
QTG
RIN
RNS
ROL
RPA
SJN
UPT
AAYXX
CITATION
ID FETCH-LOGICAL-c414t-e87278b857237dc2712d4fd56296ad9ba62ca4c67a6c4e493b71378058ac6de3
IEDL.DBID IOP
ISSN 1882-0778
IngestDate Tue Jul 01 03:36:37 EDT 2025
Thu Apr 24 22:51:22 EDT 2025
Thu Jan 07 13:54:29 EST 2021
Wed Aug 21 03:41:49 EDT 2024
IsDoiOpenAccess false
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Issue 12
Language English
Japanese
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c414t-e87278b857237dc2712d4fd56296ad9ba62ca4c67a6c4e493b71378058ac6de3
OpenAccessLink https://hdl.handle.net/2324/7183510
PageCount 4
ParticipantIDs crossref_primary_10_7567_APEX_9_125601
iop_journals_10_7567_APEX_9_125601
crossref_citationtrail_10_7567_APEX_9_125601
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2016-12-01
PublicationDateYYYYMMDD 2016-12-01
PublicationDate_xml – month: 12
  year: 2016
  text: 2016-12-01
  day: 01
PublicationDecade 2010
PublicationTitle Applied physics express
PublicationTitleAlternate Appl. Phys. Express
PublicationYear 2016
Publisher The Japan Society of Applied Physics
Publisher_xml – name: The Japan Society of Applied Physics
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SSID ssj0064316
Score 2.190913
Snippet We propose a newly improved thermodynamic analysis method that incorporates surface energies. The new theoretical approach enables us to investigate the...
SourceID crossref
iop
SourceType Enrichment Source
Index Database
Publisher
StartPage 125601
Title Advances in modeling semiconductor epitaxy: Contributions of growth orientation and surface reconstruction to InN metalorganic vapor phase epitaxy
URI https://iopscience.iop.org/article/10.7567/APEX.9.125601
Volume 9
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIOP
  databaseName: IOP Science Platform
  customDbUrl:
  eissn: 1882-0786
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0064316
  issn: 1882-0778
  databaseCode: IOP
  dateStart: 20080101
  isFulltext: true
  titleUrlDefault: https://iopscience.iop.org/
  providerName: IOP Publishing
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1bS91AEF7UUuiL9opaK9NS-tSk5yR79tK3Q1FUqPXBwulT2KuKmoSTWLQ_o7_Y2Wxy0Bah9CmBnWSXmezOfGHmG0Le4ybimc1ZooXRCeW5SZTRMuE-12rkqRMmFCd_PWR73-nBbDJbImJRC1PV_dGf4m0kCo4qDPubTxj_ND3amaUyHXdgYpk8ygVeQ-net6PhDGahwDtArRA_jjgXkV3z78fveaNlnPGOc9ldIz-GZcWckvP0qtWp-fUHY-P_rPspWe0jTphGuWdkyZXPyeMu89M0L8jvacwCaOCshK4vDjozaELOfFUGMthqDi60Frm--QyBy2rokNVA5eEEUXx7CtX8rK9hKkGVFpqruVfGQQe3FxS10FawXx7CpQu_jLoiUAM_FSIAqE_Rmw7zvCTHuzvHX_aSvlFDYuiYtokTGAUJLSY8y7k1GR9nlnqLoZVkykqtWGYUNYwrZqijMtcIjUMzBaEMsy5_RVbKqnTrBCS1GJJ6x_1EU265RHjGuXTSqzFCrdEG-TjYqzA9iXnopXFRIJgJWi6ClgtZRC1vkA8L8Tqydzwk-A7NVvT7t3lI6O09IVW7626wHy9q6zf_5UWvyROMu1jMitkiK2gG9wZjm1Zvd5_xLXqk9ds
linkProvider IOP Publishing
linkToPdf http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1Lb9QwELbaIlAvvCvKc0CIE0l3E8eOEZcVdNXlseyhSHtBkZ-0KiTRJkWFn8EvZhwnKwqqhLhF8si2ZmzPfNHMN4Q8xUvEE5OySOVaRZSnOpJaiYi7VMmRozbXvjj5_ZwdfKRvltlyg7xc18JUdf_0x_gZiIKDCv395hnje5PF_jIW8bgDE3u1cZvkUpZm3DdumH1YDO8w80XeHm75GHLEeR4YNv-e4pxH2sRVf3Mw02vk07C1kFdyEp-2KtY__mBt_N-9XydX-8gTJkH2Btmw5U1yucsA1c0t8nMSsgEaOC6h64-DTg0anztflZ4UtlqB9S1Gzr6_AM9pNXTKaqBy8BnRfHsE1eq4r2UqQZYGmtOVk9pCB7vXVLXQVjAr5_DV-l9HXTGohm8SkQDUR-hVh3Vuk8Pp_uGrg6hv2BBpOqZtZHOMhnKVZzxJudEJHyeGOoMhlmDSCCVZoiXVjEumqaUiVQiRfVOFXGpmbLpDtsqqtHcICGowNHWWu0xRbrhAmMa5sMLJMUKu0S55Ptis0D2Zue-p8aVAUOM1XXhNF6IImt4lz9bidWDxuEjwCZqu6O9xc5HQ43NCsrZn3WA_XqBd7_7LRI_IlcXrafFuNn97j2xjKMZCosx9soUWsQ8w3GnVw-5U_wIY3_tF
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Advances+in+modeling+semiconductor+epitaxy%3A+Contributions+of+growth+orientation+and+surface+reconstruction+to+InN+metalorganic+vapor+phase+epitaxy&rft.jtitle=Applied+physics+express&rft.au=Kusaba%2C+Akira&rft.au=Kangawa%2C+Yoshihiro&rft.au=Kempisty%2C+Pawel&rft.au=Shiraishi%2C+Kenji&rft.date=2016-12-01&rft.pub=The+Japan+Society+of+Applied+Physics&rft.issn=1882-0778&rft.eissn=1882-0786&rft.volume=9&rft.issue=12&rft_id=info:doi/10.7567%2FAPEX.9.125601&rft.externalDocID=AP160938
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1882-0778&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1882-0778&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1882-0778&client=summon