Series DC Arc Fault Detection Using Machine Learning Algorithms - Dang, Hoang-Long; Kim, Jaechang; Kwak, Sangshin; Choi, Seungdeog (IEEE access, 2021)
Keywords: Algorithms; Arc fault detection; Artificial intelligence; Casualties; DC arc fault; Electrical fault detection; Fault detection; Inverters; Loads (forces); Machine learning; Power systems; Property damage; series arc; Support vector machines; Switches; Time domain analysis