Reconfigurable Scan Architecture for High Diagnostic Resolution - Jang, Seokjun; Kim, Jihye; Kang, Sungho (IEEE access, 2021)
Keywords: Algorithms; Chains; Circuit faults; Circuits; Computer architecture; Cost analysis; Design for testability; Diagnostic systems; Failure analysis; Fault diagnosis; flush test; Hardware; hardware-based scan chain diagnosis; Miniaturization; multiple faults; Multiplexing; Ports (computers); Reconfiguration; Routing; Transistors