Extended Electrical and Photonic Characterization of GaN-Based Ultra-Violet MicroLEDs With an ITO Emission Window Layer

We determined the optical and electrical characteristics of GaN-based, ultraviolet micro light emitting diodes (microLEDs). Such microLEDs are essential to next-generation high-resolution micro-displays. Square-shaped microLEDs of different sizes (side lengths: 5-50 μm) were designed. The peak emiss...

Full description

Saved in:
Bibliographic Details
Published inIEEE photonics journal Vol. 12; no. 6; pp. 1 - 9
Main Authors Tsai, Yi-Lin, Huang, Sheng-Kai, Huang, Huang-Hsiung, Yang, Shu-Mei, Liang, Kai-Ling, Kuo, Wei-Hung, Fang, Yen-Hsiang, Wu, Chih-I, Wang, Shou-Wei, Shih, Hsiang-Yun, Xu, Zhiyu, Cho, Minkyu, Shen, Shyh-Chiang, Lin, Chien-Chung
Format Journal Article
LanguageEnglish
Published Piscataway IEEE 01.12.2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Arrhenius plot
Current injection
Current-voltage characteristics
Electrical properties
Emission
Gallium nitride
Gallium nitrides
GaN
Leakage current
Leakage currents
Light emitting diodes
low temperature current-voltage characterization
micro LEDs
Quantum efficiency
Temperature dependence
Ultra-violet emission
Online AccessGet full text
ISSN1943-0655
1943-0647
DOI10.1109/JPHOT.2020.3037220

Cover

Abstract We determined the optical and electrical characteristics of GaN-based, ultraviolet micro light emitting diodes (microLEDs). Such microLEDs are essential to next-generation high-resolution micro-displays. Square-shaped microLEDs of different sizes (side lengths: 5-50 μm) were designed. The peak emission wavelength of these devices shifted <0.15 nm during the current injection. The 50 μm device had a 3.8 times greater relative illumination intensity than did the 5 μm device, suggesting a degradation in quantum efficiency in small devices. Measurements of temperature-dependent reverse leakage current indicated (1) thermal activation from deep centers and (2) a high percentage of components with surface recombination current in the small devices.
AbstractList We determined the optical and electrical characteristics of GaN-based, ultraviolet micro light emitting diodes (microLEDs). Such microLEDs are essential to next-generation high-resolution micro-displays. Square-shaped microLEDs of different sizes (side lengths: 5-50 μm) were designed. The peak emission wavelength of these devices shifted <0.15 nm during the current injection. The 50 μm device had a 3.8 times greater relative illumination intensity than did the 5 μm device, suggesting a degradation in quantum efficiency in small devices. Measurements of temperature-dependent reverse leakage current indicated (1) thermal activation from deep centers and (2) a high percentage of components with surface recombination current in the small devices.
Author Lin, Chien-Chung
Fang, Yen-Hsiang
Huang, Huang-Hsiung
Wu, Chih-I
Xu, Zhiyu
Wang, Shou-Wei
Liang, Kai-Ling
Cho, Minkyu
Tsai, Yi-Lin
Yang, Shu-Mei
Shih, Hsiang-Yun
Huang, Sheng-Kai
Kuo, Wei-Hung
Shen, Shyh-Chiang
Author_xml – sequence: 1
  givenname: Yi-Lin
  surname: Tsai
  fullname: Tsai, Yi-Lin
  organization: Institute of Photonic System, College of Photonics, National Chiao Tung University, Tainan, Taiwan
– sequence: 2
  givenname: Sheng-Kai
  surname: Huang
  fullname: Huang, Sheng-Kai
  organization: Institute of Photonic System, College of Photonics, National Chiao Tung University, Tainan, Taiwan
– sequence: 3
  givenname: Huang-Hsiung
  orcidid: 0000-0003-1589-2622
  surname: Huang
  fullname: Huang, Huang-Hsiung
  organization: Institute of Photonic System, College of Photonics, National Chiao Tung University, Tainan, Taiwan
– sequence: 4
  givenname: Shu-Mei
  surname: Yang
  fullname: Yang, Shu-Mei
  organization: Industrial Technology Research Institute, Hsinchu, Taiwan
– sequence: 5
  givenname: Kai-Ling
  surname: Liang
  fullname: Liang, Kai-Ling
  organization: Industrial Technology Research Institute, Hsinchu, Taiwan
– sequence: 6
  givenname: Wei-Hung
  surname: Kuo
  fullname: Kuo, Wei-Hung
  organization: Industrial Technology Research Institute, Hsinchu, Taiwan
– sequence: 7
  givenname: Yen-Hsiang
  surname: Fang
  fullname: Fang, Yen-Hsiang
  organization: Industrial Technology Research Institute, Hsinchu, Taiwan
– sequence: 8
  givenname: Chih-I
  surname: Wu
  fullname: Wu, Chih-I
  organization: Industrial Technology Research Institute, Hsinchu, Taiwan
– sequence: 9
  givenname: Shou-Wei
  orcidid: 0000-0003-3247-7623
  surname: Wang
  fullname: Wang, Shou-Wei
  organization: Institute of Photonic System, College of Photonics, National Chiao Tung University, Tainan, Taiwan
– sequence: 10
  givenname: Hsiang-Yun
  surname: Shih
  fullname: Shih, Hsiang-Yun
  organization: Institute of Photonic System, College of Photonics, National Chiao Tung University, Tainan, Taiwan
– sequence: 11
  givenname: Zhiyu
  surname: Xu
  fullname: Xu, Zhiyu
  organization: Center for Compound Semiconductors, School of Electrical and Computer Engineering Georgia Institute of Technology, Atlanta, GA, USA
– sequence: 12
  givenname: Minkyu
  surname: Cho
  fullname: Cho, Minkyu
  organization: Center for Compound Semiconductors, School of Electrical and Computer Engineering Georgia Institute of Technology, Atlanta, GA, USA
– sequence: 13
  givenname: Shyh-Chiang
  orcidid: 0000-0003-2091-5788
  surname: Shen
  fullname: Shen, Shyh-Chiang
  organization: Center for Compound Semiconductors, School of Electrical and Computer Engineering Georgia Institute of Technology, Atlanta, GA, USA
– sequence: 14
  givenname: Chien-Chung
  orcidid: 0000-0001-8656-1922
  surname: Lin
  fullname: Lin, Chien-Chung
  email: chienchunglin@faculty.nctu.edu.tw
  organization: Institute of Photonic System, College of Photonics, National Chiao Tung University, Tainan, Taiwan
BookMark eNp9kU1v1DAQhiNUJNrCH4CLJc5ZJv6IkyMsabvVwvawpUfLdiasV2lcbFel_Hq8u20PHDjZGs3zaPS-J8XR5CcsivcVzKoK2k-XVxer9YwChRkDJimFV8Vx1XJWQs3l0ctfiDfFSYxbgLqtRHtcPHS_E0499qQb0abgrB6JnnpytfHJT86S-UYHbRMG90cn5yfiB3Kuv5dfdMzU9ZiCLn84P2Ii35wNftl9jeTGpU3WkMV6RbpbF-MOvHFT7x_IUj9ieFu8HvQY8d3Te1pcn3Xr-UW5XJ0v5p-XpeUgUkkFMjpIA4B8MFBZ0wtpJK0YGjMA1hoaboAyi8BAN5o20lAhKTbaWDGw02Jx8PZeb9VdcLc6PCqvndoPfPipdEjOjqjMgGCFqXOgmoMxWSCpRM4r3ss8y66PB9dd8L_uMSa19fdhyucryutGCpDA81Zz2MpZxBhwUNalfXI5KTeqCtSuMrWvTO0qU0-VZZT-gz4f_F_owwFyiPgCtFTUtGnYXxyBpCk
CODEN PJHOC3
CitedBy_id crossref_primary_10_1587_transele_2021DII0005
crossref_primary_10_1364_OE_455726
crossref_primary_10_1002_sdtp_16760
crossref_primary_10_1109_JPHOT_2023_3285667
crossref_primary_10_1039_D1NR05288H
crossref_primary_10_1364_OE_543951
Cites_doi 10.1038/nphoton.2006.36
10.1016/j.watres.2010.11.015
10.1364/OE.27.00A643
10.1063/1.3276156
10.1021/acsami.7b03386
10.1063/1.1784882
10.1016/j.renene.2005.08.034
10.1093/nar/20.2.225
10.1063/1.3668104
10.1109/TED.2015.2443135
10.1038/nphoton.2012.328
10.7567/APEX.10.032101
10.1364/PRJ.7.000B41
10.1109/IPCon.2019.8908371
10.1109/JSTQE.2017.2681039
10.1038/s41598-020-59442-0
10.1364/OE.26.021324
10.1143/JJAP.40.L583
10.1364/OE.23.032504
10.1109/2944.999183
10.1063/1.1593218
10.1088/1361-6528/ab4201
10.1063/1.4940949
10.1088/0268-1242/29/8/084004
10.1063/1.1719264
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020
DBID 97E
ESBDL
RIA
RIE
AAYXX
CITATION
7SP
7U5
8FD
H8D
L7M
DOA
DOI 10.1109/JPHOT.2020.3037220
DatabaseName IEEE Xplore (IEEE)
IEEE Xplore Open Access Journals
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Aerospace Database
Advanced Technologies Database with Aerospace
DOAJ Directory of Open Access Journals
DatabaseTitle CrossRef
Aerospace Database
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList

Aerospace Database
Database_xml – sequence: 1
  dbid: DOA
  name: DOAJ Directory of Open Access Journals
  url: https://www.doaj.org/
  sourceTypes: Open Website
– sequence: 2
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Applied Sciences
EISSN 1943-0647
EndPage 9
ExternalDocumentID oai_doaj_org_article_bfe0c5b6110a40bbabc727e4414d710a
10_1109_JPHOT_2020_3037220
9256288
Genre orig-research
GrantInformation_xml – fundername: Ministry of Science and Technology, Taiwan
  grantid: MOST 107-2221-E-009-114-MY3
  funderid: 10.13039/501100004663
GroupedDBID 0R~
29O
4.4
5VS
6IK
97E
AAFWJ
AAJGR
ABAZT
ABVLG
ACIWK
ADBBV
AENEX
AETIX
AFPKN
AGSQL
ALMA_UNASSIGNED_HOLDINGS
BCNDV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
EBS
EJD
ESBDL
GROUPED_DOAJ
HZ~
IPLJI
JAVBF
M43
M~E
O9-
OCL
OK1
RIA
RIE
AAYXX
CITATION
RIG
7SP
7U5
8FD
H8D
L7M
ID FETCH-LOGICAL-c405t-25e32f7b00e4fb01cbd57b7213ebbf0e6a084b023ce030a8a287b2572e8abc5f3
IEDL.DBID DOA
ISSN 1943-0655
IngestDate Wed Aug 27 01:26:08 EDT 2025
Fri Jul 25 12:22:31 EDT 2025
Tue Jul 01 00:08:43 EDT 2025
Thu Apr 24 22:59:52 EDT 2025
Wed Aug 27 06:02:23 EDT 2025
IsDoiOpenAccess true
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Issue 6
Language English
License https://creativecommons.org/licenses/by/4.0/legalcode
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c405t-25e32f7b00e4fb01cbd57b7213ebbf0e6a084b023ce030a8a287b2572e8abc5f3
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ORCID 0000-0003-2091-5788
0000-0003-3247-7623
0000-0003-1589-2622
0000-0001-8656-1922
OpenAccessLink https://doaj.org/article/bfe0c5b6110a40bbabc727e4414d710a
PQID 2468750704
PQPubID 85514
PageCount 9
ParticipantIDs crossref_citationtrail_10_1109_JPHOT_2020_3037220
ieee_primary_9256288
proquest_journals_2468750704
crossref_primary_10_1109_JPHOT_2020_3037220
doaj_primary_oai_doaj_org_article_bfe0c5b6110a40bbabc727e4414d710a
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2020-12-01
PublicationDateYYYYMMDD 2020-12-01
PublicationDate_xml – month: 12
  year: 2020
  text: 2020-12-01
  day: 01
PublicationDecade 2020
PublicationPlace Piscataway
PublicationPlace_xml – name: Piscataway
PublicationTitle IEEE photonics journal
PublicationTitleAbbrev JPHOT
PublicationYear 2020
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref13
ref12
ref14
ref11
ref2
ref1
ref17
ref16
ref19
ref18
ref24
ref23
ref26
ref25
ref20
ref22
ref21
sze (ref15) 1981
ref27
hsu (ref10) 2015; 7
ref8
ref7
ref9
ref4
ref3
ref6
ref5
References_xml – ident: ref1
  doi: 10.1038/nphoton.2006.36
– ident: ref4
  doi: 10.1016/j.watres.2010.11.015
– ident: ref27
  doi: 10.1364/OE.27.00A643
– ident: ref19
  doi: 10.1063/1.3276156
– ident: ref13
  doi: 10.1021/acsami.7b03386
– volume: 7
  year: 2015
  ident: ref10
  article-title: Highly stable and efficient hybrid quantum dot light-emitting diodes
  publication-title: IEEE Photon J
– ident: ref2
  doi: 10.1063/1.1784882
– ident: ref3
  doi: 10.1016/j.renene.2005.08.034
– ident: ref7
  doi: 10.1093/nar/20.2.225
– ident: ref21
  doi: 10.1063/1.3668104
– ident: ref24
  doi: 10.1109/TED.2015.2443135
– ident: ref9
  doi: 10.1038/nphoton.2012.328
– ident: ref25
  doi: 10.7567/APEX.10.032101
– ident: ref5
  doi: 10.1364/PRJ.7.000B41
– ident: ref14
  doi: 10.1109/IPCon.2019.8908371
– ident: ref11
  doi: 10.1109/JSTQE.2017.2681039
– ident: ref20
  doi: 10.1038/s41598-020-59442-0
– ident: ref26
  doi: 10.1364/OE.26.021324
– ident: ref18
  doi: 10.1143/JJAP.40.L583
– ident: ref12
  doi: 10.1364/OE.23.032504
– ident: ref6
  doi: 10.1109/2944.999183
– ident: ref16
  doi: 10.1063/1.1593218
– ident: ref8
  doi: 10.1088/1361-6528/ab4201
– year: 1981
  ident: ref15
  publication-title: Physics of Semiconductor Devices
– ident: ref22
  doi: 10.1063/1.4940949
– ident: ref17
  doi: 10.1088/0268-1242/29/8/084004
– ident: ref23
  doi: 10.1063/1.1719264
SSID ssj0069159
Score 2.2670445
Snippet We determined the optical and electrical characteristics of GaN-based, ultraviolet micro light emitting diodes (microLEDs). Such microLEDs are essential to...
SourceID doaj
proquest
crossref
ieee
SourceType Open Website
Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 1
SubjectTerms Arrhenius plot
Current injection
Current-voltage characteristics
Electrical properties
Emission
Gallium nitride
Gallium nitrides
GaN
Leakage current
Leakage currents
Light emitting diodes
low temperature current-voltage characterization
micro LEDs
Quantum efficiency
Temperature dependence
Ultra-violet emission
SummonAdditionalLinks – databaseName: IEEE Electronic Library (IEL)
  dbid: RIE
  link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3BbtQwEB21PXGhlILYUpAP3CBbx3Gy8ZG2KUvVbXvYhd4sT-KoiCqpullV4usZO06EACFuUZRYjt5k5o3teQPwDlHFxjidShNjRN5PRCqxSSQEoqfMwrp658VlNl_J85v0Zgs-jLUw1lp_-MxO3aXfy6_acuOWyo4UxWeR59uwTWbW12oNXjdTFJeHohiujs6v51dLSv8EZaU8mQnXz_uXwOP1-UNDlT-8sA8tZ7uwGCbVnyj5Pt10OC1__KbX-L-zfgZPA8dkH3uj2IMt2zyH3cA3Wfib1_vwWIQVcFb4ZjgOL2aail3ftp2TzGUno5xzX63J2pp9MpfRMcW-iq3uugcTfXFb-x1buJN9F8Xpmn391t3SMOzz8ooVZEZuPY5uNlX7yC4MUfwXsDorlifzKDRiiEric10kUpuIekbgWVkjj0us0hlS7phYxJrbzPBcIkV_13yMm9xQGobkC4TNDZZpnbyEnaZt7CtgTs8uMzbOKotSUXAs07REJU2lyNWkyQTiASVdBpVy1yzjTvtshSvtkdUOWR2QncD78Z37XqPjn08fO_DHJ52-tr9BoOnwu2qsLS9TzGgMIzkifQYRPUvcUVbEycwE9h3Q4yAB4wkcDqakgy9YayEzSgrJtcqDv7_1Gp64CfaHZA5hp3vY2DdEdTp86238J5Kx-xU
  priority: 102
  providerName: IEEE
Title Extended Electrical and Photonic Characterization of GaN-Based Ultra-Violet MicroLEDs With an ITO Emission Window Layer
URI https://ieeexplore.ieee.org/document/9256288
https://www.proquest.com/docview/2468750704
https://doaj.org/article/bfe0c5b6110a40bbabc727e4414d710a
Volume 12
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwrV1LT8MwDI4QJy68EeOlHLihijRNu-bIozAQr8MG3KK4TQXS1CFWxN_HTrMJCQkuXKs0bW3Hn53Gnxk7BNCxtcRTaWOI0PvJSCcuiaQE8CGzdFTvfHuXDUbq-jl9_tbqi86EdfTAneCOoXaiTCFDmLJKAFgoEXIdoriqEB19aCS0mCVTnQ_ONKL0rERG6OPrh8H9EJNBiTmqSPqSunt_gyHP1h_aq_zwyR5oLlbZcogQ-Un3ZmtswTXrbCVEizysxekG-yzC_jUvfCsbkja3TcUfXiYtEd7yszkZc1drySc1v7R30SkiV8VH4_bdRo_0Y77lt3Qu76Y4n_Kn1_YFp-FXw3teoBHQbhpebKrJJ7-xGKBvstFFMTwbRKGNQlRiNNZGMnWJrPsoeqdqEHEJVdoHzPwSB1ALl1mRK0DsptZhwuYWkyjAlSxdjsJO62SLLTaTxm0zTmx0mXVxVjlQGqGtTNMStLKVRkeRJj0Wz6RqysAxTq0uxsbnGkIbrwlDmjBBEz12NL_nrWPY-HX0KSlrPpLYsf0FtBkTbMb8ZTM9tkGqnk-iMe6Ted5jezPVm7CSp0aqDFM6dIxq5z8evcuW6HO6AzF7bLF9_3D7GNa0cOAt-MBXIH4BPVLzDQ
linkProvider Directory of Open Access Journals
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3BbtQwEB2VcoBLWyiIhRZ84AbZJo6TTY60pGzL7raHXejN8jiOilolqJtVJb6eseNECBDiFkWx5ejZM29szxuAt4h5pJTVqVQRBmT9eJDHJg44R3SUmRub7zxfpNOVOL9Krrbg_ZALY4xxl8_M2D66s_yy0Ru7VXaUk3_mWfYAHpLfFz5bq7e7aU6euU-LCfOj88vpxZICQE5xaRhPuK3o_YvrcQr9vqTKH3bYOZfTXZj3w-rulNyMNy2O9Y_fFBv_d9x7sONZJvvQTYsnsGXqp7DrGSfz63m9D_eF3wNnhSuHYxFjqi7Z5XXTWtFcdjIIOnf5mqyp2Ce1CI7J-5VsddveqeCLPdxv2dze7ZsVH9fs67f2mrphZ8sLVtBEsjty9LIum3s2U0Tyn8HqtFieTANfiiHQxOjagCcm5tWE4DOiwjDSWCYTpOgxNohVaFIVZgLJ_9vyY6HKFAViSNaAm0yhTqr4OWzXTW1eALOKdqkyUVoaFDm5R50kGnOhypyMTRKPIOpRktrrlNtyGbfSxSthLh2y0iIrPbIjeDe0-d6pdPzz62ML_vClVdh2Lwg06ResxMqEOsGU-lAiRKTfIKpniD2KkliZGsG-BXroxGM8goN-KklvDdaSi5TCQjKu4uXfW72BR9PlfCZnZ4vPr-CxHWx3ZeYAttu7jTkk4tPiazfffwLSKf5g
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Extended+Electrical+and+Photonic+Characterization+of+GaN-Based+Ultra-Violet+MicroLEDs+With+an+ITO+Emission+Window+Layer&rft.jtitle=IEEE+photonics+journal&rft.au=Yi-Lin+Tsai&rft.au=Sheng-Kai+Huang&rft.au=Huang-Hsiung+Huang&rft.au=Shu-Mei+Yang&rft.date=2020-12-01&rft.pub=IEEE&rft.eissn=1943-0647&rft.volume=12&rft.issue=6&rft.spage=1&rft.epage=9&rft_id=info:doi/10.1109%2FJPHOT.2020.3037220&rft.externalDBID=DOA&rft.externalDocID=oai_doaj_org_article_bfe0c5b6110a40bbabc727e4414d710a
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1943-0655&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1943-0655&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1943-0655&client=summon