Characterization Methodology for Voltage-Dependent Mobility of Charge Carriers in Graphene FETs Using Single-Device Microwave Measurements - Ribero-Figueroa, Xiomara; Pacheco-Sanchez, Anibal; Mansouri, Aida; Kumar, Pankaj; Habibpour, Omid; Zirath, Herbert; Anzi, Luca; Zurutuza, Amaia; Sordan, Roman; Jimenez, David; Pasadas, Francisco; Torres-Torres, Reydezel (IEEE journal of microwaves, 2025)
Keywords: S -parameters; Capacitance; channel mobility; Electrical resistance measurement; Equivalent circuits; Graphene; Graphene field-effect transistor; Integrated circuit modeling; Logic gates; oxide capacitance; Parameter extraction; S-parameters; Scattering parameters; single device; small-signal; Transistors; Voltage measurement