Extracting Microfacet-based BRDF Parameters from Arbitrary Materials with Power Iterations
We introduce a novel fitting procedure that takes as input an arbitrary material, possibly anisotropic, and automatically converts it to a microfacet BRDF. Our algorithm is based on the property that the distribution of microfacets may be retrieved by solving an eigenvector problem that is built sol...
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| Published in | Computer graphics forum Vol. 34; no. 4; pp. 21 - 30 |
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| Main Authors | , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Oxford
Blackwell Publishing Ltd
01.07.2015
Wiley |
| Subjects | |
| Online Access | Get full text |
| ISSN | 0167-7055 1467-8659 |
| DOI | 10.1111/cgf.12675 |
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| Abstract | We introduce a novel fitting procedure that takes as input an arbitrary material, possibly anisotropic, and automatically converts it to a microfacet BRDF. Our algorithm is based on the property that the distribution of microfacets may be retrieved by solving an eigenvector problem that is built solely from backscattering samples. We show that the eigenvector associated to the largest eigenvalue is always the only solution to this problem, and compute it using the power iteration method. This approach is straightforward to implement, much faster to compute, and considerably more robust than solutions based on nonlinear optimizations. In addition, we provide simple conversion procedures of our fits into both Beckmann and GGX roughness parameters, and discuss the advantages of microfacet slope space to make our fits editable. We apply our method to measured materials from two large databases that include anisotropic materials, and demonstrate the benefits of spatially varying roughness on texture mapped geometric models. |
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| AbstractList | We introduce a novel fitting procedure that takes as input an arbitrary material, possibly anisotropic, and automatically converts it to a microfacet BRDF. Our algorithm is based on the property that the distribution of microfacets may be retrieved by solving an eigenvector problem that is built solely from backscattering samples. We show that the eigenvector associated to the largest eigenvalue is always the only solution to this problem, and compute it using the power iteration method. This approach is straightforward to implement, much faster to compute, and considerably more robust than solutions based on nonlinear optimizations. In addition, we provide simple conversion procedures of our fits into both Beckmann and GGX roughness parameters, and discuss the advantages of microfacet slope space to make our fits editable. We apply our method to measured materials from two large databases that include anisotropic materials, and demonstrate the benefits of spatially varying roughness on texture mapped geometric models. |
| Author | Poulin, Pierre Heitz, Eric Iehl, Jean-Claude Dupuy, Jonathan Ostromoukhov, Victor |
| Author_xml | – sequence: 1 givenname: Jonathan surname: Dupuy fullname: Dupuy, Jonathan email: jdupuy@liris.cnrs.fr organization: LIRIS, Université Lyon – sequence: 2 givenname: Eric surname: Heitz fullname: Heitz, Eric email: eheitz.research@gmail.com organization: Karlsruhe Institute of Technology – sequence: 3 givenname: Jean-Claude surname: Iehl fullname: Iehl, Jean-Claude email: jciehl@liris.cnrs.fr organization: LIRIS, Université Lyon – sequence: 4 givenname: Pierre surname: Poulin fullname: Poulin, Pierre email: poulin@iro.umontreal.ca organization: LIGUM, Université de Montréal – sequence: 5 givenname: Victor surname: Ostromoukhov fullname: Ostromoukhov, Victor email: victor.ostromoukhov@liris.cnrs.fr organization: LIRIS, Université Lyon |
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| Cites_doi | 10.1007/BF01449896 10.1007/978-3-7091-6453-2_2 10.1145/882262.882343 10.1111/cgf.12477 10.1145/2614028.2615431 10.1364/AO.9.001474 10.1111/j.1467-8659.2012.03147.x 10.1364/JOSA.65.000531 10.1109/TAP.1967.1138991 10.1145/2508363.2508422 10.1364/JOSA.57.001105 10.1111/cgf.12417 10.1145/2077341.2077350 10.1145/1360612.1360640 |
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| Copyright | 2015 The Author(s) Computer Graphics Forum © 2015 The Eurographics Association and John Wiley & Sons Ltd. Published by John Wiley & Sons Ltd. 2015 The Eurographics Association and John Wiley & Sons Ltd. Distributed under a Creative Commons Attribution 4.0 International License |
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| References_xml | – reference: Perron O.: Zur theorie der matrices. Mathematische Annalen 64, 2 (1907), 248-263. 4 – reference: Torrance K.E., Sparrow E.M.: Theory for off-specular reflection from roughened surfaces. J. Opt. Soc. Am. 57, 9 (Sep 1967), 1105-1112. 2 – reference: Wang J., Zhao S., Tong X., Snyder J., Guo B.: Modeling anisotropic surface reflectance with example-based microfacet synthesis. ACM Trans. Graph. 27, 3 (Aug. 2008), 41:1-9. 2, 7 – reference: Löw J., Kronander J., Ynnerman A., Unger J.: BRDF models for accurate and efficient rendering of glossy surfaces. ACM Trans. Graph. 31, 1 (2012), 9:1-14. 2, 6, 7, 10 – reference: Polyanin A.D., Manzhirov A.V.: Handbook of integral equations. CRC Press, 2012. 4 – reference: Heitz E.: Understanding the masking-shadowing function in microfacet-based BRDFs. Journal of Computer Graphics Techniques (JCGT) 3, 2 (2014), 32-91. 3, 4, 9 – reference: Smith B.: Geometrical shadowing of a random rough surface. IEEE Trans. Antennas and Propagation 15, 5 (1967), 668-671. 2, 3 – reference: Dupuy J., Heitz E., Iehl J.-C., Poulin P., Neyret F., Ostromoukhov V.: Linear efficient antialiased displacement and reflectance mapping. ACM Trans. Graph. 32, 6 (Nov. 2013), 211:1-11. 9 – reference: Matusik W., Pfister H., Brand M., McMillan L.: A data-driven reflectance model. ACM Trans. Graph. 22, 3 (2003), 759-769. 6, 7, 10 – reference: Nicodemus F., Richmond J., Hsia J., Ginsberg W., Limperis T.: Geometrical considerations and nomenclature for reflectance. Applied Optics 9 (1977), 1474-1475. 2 – reference: Trowbridge T.S., Reitz K.P.: Average irregularity representation of a rough surface for ray reflection. J. Opt. Soc. Am. 65, 5 (May 1975), 531-536. 8 – reference: Bagher M.M., Soler C., Holzschuch N.: Accurate fitting of measured reflectances using a shifted gamma micro-facet distribution. Comput. Graph. Forum 31, 4 (2012), 1509-1518. 2, 6, 7, 10 – reference: FILIP J., Vavra R.: Template-based sampling of anisotropic BRDFs. Comput. Graph. Forum (Pacific Graphics) 33, 7 (2014), 91-99. 7, 10 – volume: 31 start-page: 1509 issue: 4 year: 2012 end-page: 1518 article-title: Accurate fitting of measured reflectances using a shifted gamma micro‐facet distribution publication-title: Comput. Graph. Forum – start-page: 117 year: 2005 end-page: 226 – volume: 64 start-page: 248 issue: 2 year: 1907 end-page: 263 article-title: Zur theorie der matrices publication-title: Mathematische Annalen – volume: 32 start-page: 211:1 issue: 6 year: 2013 end-page: 11 article-title: Linear efficient antialiased displacement and reflectance mapping publication-title: ACM Trans. Graph – volume: 15 start-page: 668 issue: 5 year: 1967 end-page: 671 article-title: Geometrical shadowing of a random rough surface publication-title: IEEE Trans. Antennas and Propagation – volume: 27 start-page: 41:1 issue: 3 year: 2008 end-page: 9 article-title: Modeling anisotropic surface reflectance with example‐based microfacet synthesis publication-title: ACM Trans. Graph – start-page: 23:1 year: 2014 end-page: 8 – year: 2007 – start-page: 456 year: 1912 end-page: 477 – volume: 9 start-page: 1474 year: 1977 end-page: 1475 article-title: Geometrical considerations and nomenclature for reflectance publication-title: Applied Optics – volume: 33 start-page: 91 issue: 7 year: 2014 end-page: 99 article-title: Template‐based sampling of anisotropic BRDFs publication-title: Comput. Graph. Forum (Pacific Graphics) – start-page: 195 year: 2007 end-page: 206 – volume: 31 start-page: 9:1 issue: 1 year: 2012 end-page: 14 article-title: BRDF models for accurate and efficient rendering of glossy surfaces publication-title: ACM Trans. Graph – start-page: 103 year: 2014 end-page: 112 – start-page: 11 year: 1998 end-page: 22 – volume: 22 start-page: 759 issue: 3 year: 2003 end-page: 769 article-title: A data‐driven reflectance model publication-title: ACM Trans. Graph – volume: 65 start-page: 531 issue: 5 year: 1975 end-page: 536 article-title: Average irregularity representation of a rough surface for ray reflection publication-title: J. Opt. Soc. Am – volume: 57 start-page: 1105 issue: 9 year: 1967 end-page: 1112 article-title: Theory for off‐specular reflection from roughened surfaces publication-title: J. Opt. Soc. 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Eurographics Symposium on Rendering year: 2005 ident: e_1_2_9_14_2 – start-page: 195 volume-title: Proc. Eurographics Symposium on Rendering year: 2007 ident: e_1_2_9_22_2 – ident: e_1_2_9_23_2 doi: 10.1145/1360612.1360640 |
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| SubjectTerms | Algorithms and texture Anisotropy Backscattering Categories and Subject Descriptors (according to ACM CCS) Computer graphics Computer Science Eigenvectors Graphics I.3.3 [Computer Graphics]: Picture/Image Generation-Antialiasing I.3.7 [Computer Graphics]: Three-Dimensional Graphics and Realism-Color I.3.7 [Computer Graphics]: Three‐Dimensional Graphics and Realism—Color, shading, shadowing, and texture Iterative methods Lighting Mathematical models Roughness shading shadowing Studies Surface layer Texture |
| Title | Extracting Microfacet-based BRDF Parameters from Arbitrary Materials with Power Iterations |
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