An Imperfect Fault Coverage Model With Coverage of Irrelevant Components

This paper addresses the coverage (including identification and isolation) of irrelevant components in systems with imperfect fault coverage (IFC). In fault-tolerant systems, a single not-covered component fault may thwart the automatic recovery mechanisms, and lead to a system or subsystem failure....

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on reliability Vol. 64; no. 1; pp. 320 - 332
Main Authors Jianwen Xiang, Machida, Fumio, Tadano, Kumiko, Maeno, Yoshiharu
Format Journal Article
LanguageEnglish
Published IEEE 01.03.2015
Subjects
Online AccessGet full text
ISSN0018-9529
1558-1721
DOI10.1109/TR.2014.2363155

Cover

Abstract This paper addresses the coverage (including identification and isolation) of irrelevant components in systems with imperfect fault coverage (IFC). In fault-tolerant systems, a single not-covered component fault may thwart the automatic recovery mechanisms, and lead to a system or subsystem failure. The models that consider the effects of IFC are known as coverage models (CMs). In traditional CMs, except those considering functional dependency (a similar concept to relevancy but with different assumptions and semantics), coverage is typically limited to faulty components regardless of their relevancies. Consequently, an operational but irrelevant component will not be isolated, and may threaten the system by its future uncovered (not-covered) failures. Although the system is generally assumed to be coherent, which implies the relevancy of each component in the initial system state, the traditional CMs do not consider the fact that an initially relevant component could become irrelevant after the failures of other components. We propose the irrelevancy coverage model (ICM) to cover the irrelevant components in addition to the faulty components. In the ICM, a component will be isolated from the system whenever it becomes irrelevant (even it is not failed), such that its future not-covered failures will not affect the system anymore. By incorporating the coverage of irrelevant components, the ICM opens up a new cost-effective approach to improve system reliability without additional redundancy.
AbstractList This paper addresses the coverage (including identification and isolation) of irrelevant components in systems with imperfect fault coverage (IFC). In fault-tolerant systems, a single not-covered component fault may thwart the automatic recovery mechanisms, and lead to a system or subsystem failure. The models that consider the effects of IFC are known as coverage models (CMs). In traditional CMs, except those considering functional dependency (a similar concept to relevancy but with different assumptions and semantics), coverage is typically limited to faulty components regardless of their relevancies. Consequently, an operational but irrelevant component will not be isolated, and may threaten the system by its future uncovered (not-covered) failures. Although the system is generally assumed to be coherent, which implies the relevancy of each component in the initial system state, the traditional CMs do not consider the fact that an initially relevant component could become irrelevant after the failures of other components. We propose the irrelevancy coverage model (ICM) to cover the irrelevant components in addition to the faulty components. In the ICM, a component will be isolated from the system whenever it becomes irrelevant (even it is not failed), such that its future not-covered failures will not affect the system anymore. By incorporating the coverage of irrelevant components, the ICM opens up a new cost-effective approach to improve system reliability without additional redundancy.
Author Maeno, Yoshiharu
Machida, Fumio
Tadano, Kumiko
Jianwen Xiang
Author_xml – sequence: 1
  surname: Jianwen Xiang
  fullname: Jianwen Xiang
  email: xiangjw@gmail.com
  organization: Wuhan Univ. of Technol., Wuhan, China
– sequence: 2
  givenname: Fumio
  surname: Machida
  fullname: Machida, Fumio
  email: f-machida@ab.jp.nec.com
  organization: NEC Corp., Kawasaki, Japan
– sequence: 3
  givenname: Kumiko
  surname: Tadano
  fullname: Tadano, Kumiko
  email: k-tadano@bq.jp.nec.com
  organization: NEC Corp., Kawasaki, Japan
– sequence: 4
  givenname: Yoshiharu
  surname: Maeno
  fullname: Maeno, Yoshiharu
  email: y-maeno@aj.jp.nec.com
  organization: NEC Corp., Kawasaki, Japan
BookMark eNp9kE9Lw0AQxRepYFs9e_CSL5B2Z_8ku8dS1BYqQql4DJPtrEbSpGzWgt_elBYFD15mmOH95g1vxAZN2xBjt8AnANxON-uJ4KAmQmYStL5gw76aFHIBAzbkHExqtbBXbNR1H_2olDVDtpg1yXK3p-DJxeQBP-uYzNsDBXyj5KndUp28VvH9d9f6ZBkC1XTA5ijd7fs3mthds0uPdUc35z5mLw_3m_kiXT0_LuezVeoUh5gK0KUiIdCZ3HOe5aWyuctUmaPZemFKQG9sVgq7lShL5YFLjdwoh8YSkRwzfbrrQtt1gXzhqoixapsYsKoL4MUxjmKzLo5xFOc4em76h9uHaofh6x_i7kRUve-POrNSWp3JbyWibDE
CODEN IERQAD
CitedBy_id crossref_primary_10_1080_03772063_2020_1791741
crossref_primary_10_1016_j_ress_2017_05_004
crossref_primary_10_1016_j_ress_2022_108553
crossref_primary_10_1109_TR_2017_2738659
crossref_primary_10_1016_j_ress_2023_109305
crossref_primary_10_1080_00223131_2022_2062473
crossref_primary_10_1109_TR_2020_2965618
crossref_primary_10_1016_j_ress_2022_108567
crossref_primary_10_1007_s13198_019_00926_2
crossref_primary_10_1080_24725854_2017_1342056
crossref_primary_10_1142_S0218126624502591
Cites_doi 10.1109/ARMS.1990.67971
10.1109/RAMS.2010.5447994
10.1109/T-C.1973.223703
10.1016/j.ress.2012.10.001
10.1109/24.159800
10.1109/24.799899
10.1109/SSIRI.2011.32
10.1016/S0951-8320(03)00143-1
10.1016/j.ress.2010.06.014
10.2514/6.1993-4574
10.1109/TR.2004.829137
10.1007/978-3-642-24485-8_41
10.1016/0951-8320(93)90060-C
10.1109/12.24286
10.1109/TR.2009.2035793
10.1016/S0951-8320(97)00034-3
10.1587/transfun.E96.A.1649
10.1109/RAMS.1993.296853
10.1109/24.799898
10.1109/24.376525
ContentType Journal Article
DBID 97E
RIA
RIE
AAYXX
CITATION
DOI 10.1109/TR.2014.2363155
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEL(IEEE/IET Electronic Library )
CrossRef
DatabaseTitle CrossRef
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1558-1721
EndPage 332
ExternalDocumentID 10_1109_TR_2014_2363155
6933956
Genre orig-research
GroupedDBID -~X
.DC
0R~
29I
4.4
5GY
5VS
6IK
8WZ
97E
A6W
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
ACNCT
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
H~9
IAAWW
IBMZZ
ICLAB
IDIHD
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
MS~
OCL
P2P
RIA
RIE
RNS
TN5
VH1
VJK
AAYXX
CITATION
ID FETCH-LOGICAL-c401t-215b4e22ac87f0067b497c64b7a8df28b1af896b29d3a3b4f1035a084ca89eee3
IEDL.DBID RIE
ISSN 0018-9529
IngestDate Thu Apr 24 23:10:10 EDT 2025
Wed Oct 01 01:27:23 EDT 2025
Tue Aug 26 16:50:05 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 1
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c401t-215b4e22ac87f0067b497c64b7a8df28b1af896b29d3a3b4f1035a084ca89eee3
PageCount 13
ParticipantIDs crossref_citationtrail_10_1109_TR_2014_2363155
ieee_primary_6933956
crossref_primary_10_1109_TR_2014_2363155
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2015-03-01
PublicationDateYYYYMMDD 2015-03-01
PublicationDate_xml – month: 03
  year: 2015
  text: 2015-03-01
  day: 01
PublicationDecade 2010
PublicationTitle IEEE transactions on reliability
PublicationTitleAbbrev TR
PublicationYear 2015
Publisher IEEE
Publisher_xml – name: IEEE
References ref12
xiang (ref14) 2013
ref15
dutuit (ref13) 1997; 58
ref11
ref10
ref1
ref16
ref19
xing (ref17) 2002
ref18
amari (ref2) 2008
trivedi (ref25) 2002
izukura (ref24) 2011; lncs 6981
doyle (ref22) 1998
ref23
ref20
ref21
ref8
ref7
ref9
ref4
ref3
ref6
ref5
References_xml – ident: ref9
  doi: 10.1109/ARMS.1990.67971
– ident: ref4
  doi: 10.1109/RAMS.2010.5447994
– year: 2008
  ident: ref2
  publication-title: Handbook of Performability Engineering
– ident: ref1
  doi: 10.1109/T-C.1973.223703
– ident: ref6
  doi: 10.1016/j.ress.2012.10.001
– ident: ref3
  doi: 10.1109/24.159800
– ident: ref20
  doi: 10.1109/24.799899
– ident: ref23
  doi: 10.1109/SSIRI.2011.32
– ident: ref10
  doi: 10.1016/S0951-8320(03)00143-1
– ident: ref5
  doi: 10.1016/j.ress.2010.06.014
– ident: ref21
  doi: 10.2514/6.1993-4574
– ident: ref18
  doi: 10.1109/TR.2004.829137
– volume: lncs 6981
  start-page: 563
  year: 2011
  ident: ref24
  article-title: Applying a model-based approach to it systems development using SysML extension
  publication-title: Proc ACM/IEEE 14th Int Conf Model Driven Engineering Languages and Systems (MODELS 2011)
  doi: 10.1007/978-3-642-24485-8_41
– year: 2002
  ident: ref25
  publication-title: Probability and Statistics with Reliability Queuing and Computer Science Applications
– ident: ref19
  doi: 10.1016/0951-8320(93)90060-C
– ident: ref16
  doi: 10.1109/12.24286
– ident: ref12
  doi: 10.1109/TR.2009.2035793
– start-page: 249
  year: 1998
  ident: ref22
  article-title: Dependability assessment using binary decision diagrams (BDDs)
  publication-title: Proc 25th IEEE Int Symp Fault-Tolerant Computing (FTCS-98)
– volume: 58
  start-page: 127
  year: 1997
  ident: ref13
  article-title: Exact and truncated computations of prime implicants of coherent and non-coherent fault trees within aralia
  publication-title: Rel Eng Syst Safety
  doi: 10.1016/S0951-8320(97)00034-3
– start-page: 58
  year: 2013
  ident: ref14
  article-title: A static analysis of dynamic fault trees with Priority-AND gates
  publication-title: Proc of the 5th Latin-American Symp on Dependable Computing (LADC)
– ident: ref11
  doi: 10.1587/transfun.E96.A.1649
– ident: ref15
  doi: 10.1109/RAMS.1993.296853
– year: 2002
  ident: ref17
  article-title: Dependability analysis using multiple- valued decision diagrams
  publication-title: Proc 6th Int Conf Probabilistic Safety Assessment and Management (PSAM6)
– ident: ref8
  doi: 10.1109/24.799898
– ident: ref7
  doi: 10.1109/24.376525
SSID ssj0014498
Score 2.2056596
Snippet This paper addresses the coverage (including identification and isolation) of irrelevant components in systems with imperfect fault coverage (IFC). In...
SourceID crossref
ieee
SourceType Enrichment Source
Index Database
Publisher
StartPage 320
SubjectTerms coherent systems
Fault tolerant systems
fault tree
Fault trees
Imperfect fault coverage
irrelevancy
irrelevancy trigger
Logic gates
Markov processes
Redundancy
Semantics
Title An Imperfect Fault Coverage Model With Coverage of Irrelevant Components
URI https://ieeexplore.ieee.org/document/6933956
Volume 64
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1558-1721
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0014498
  issn: 0018-9529
  databaseCode: RIE
  dateStart: 19630101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwELZKJxh4FUR5KQMDA0mT2EnssaqoWqQyVK3oFvkpECWtqmTh13NO0lAhkNgiy1acO8f3nf3dHUJ32JeAw3nsGs0SlyifuZRI6holwBoDQEjKWoeT53g0J0-LaNFCD00sjNa6JJ9pzz6Wd_lqJQt7VNaLwfsGPL-H9hIaV7FazY0BIazedeEHjkJWp_EJfNabTS2Fi3ghjnFgY_p2LNBOSZXSogyP0GQ7l4pI8u4VufDk5480jf-d7DE6rKGl06_Wwglq6ewUHewkHOygUT9zxgCUN5bE4Qx5scydgSVxwq7i2LJoS-flLX_9blsZZ7yxdVUAcNuuH-tVZqkXZ2g-fJwNRm5dS8GV4EHlLlh2QXQYckkTY02UICyRMREJp8qEVATcUBaLkCnMsSAm8HHEfdAbpwy-DZ-jdgZvuEBOaALMQQGJVowIQ7kyBGuOdUSkDAPVRd5WvqmsE43behfLtHQ4fJbOpqlVSForpIvumwHrKsfG3107VtJNt1rIl783X6F9GBxVlLFr1M43hb4BDJGL23LxfAFAYsJd
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwED6VMgADr4IozwwMDCQksZPYY1VRtdB2qFLRLbIdWyBKW1Xpwq_HTtJQIZDYIstJnDvH95393R3ALXKFxuEstJWkkY1Tl9oEC2KrlGtrrAFClNc6HAzD7hg_TYJJDe6rWBgpZU4-k465zM_y07lYma2yh1B73xrPb8F2gDEOimit6swAY1quu_oXDnxaJvLxXPoQjwyJCzs-CpFnovo2bNBGUZXcpnQOYLAeTUEleXdWGXfE549Ejf8d7iHsl-DSahWz4QhqcnYMexspBxvQbc2snobKS0PjsDpsNc2stqFx6nXFMoXRptbLW_b63TZXVm9pKqtoyG26fizmM0O-OIFx5zFud-2ymoIttA-V2dq2cyx9nwkSKWOkOKaRCDGPGEmVT7jHFKEh92mKGOJYeS4KmKs1xwjV34ZOoT7TbzgDy1ceYhEJI5lSzBVhqcJIMiQDLITvpU1w1vJNRJlq3FS8mCa5y-HSJB4lRiFJqZAm3FU3LIosG393bRhJV91KIZ__3nwDO9140E_6veHzBezqBwUFgewS6tlyJa80osj4dT6RvgCbvsWq
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=An+Imperfect+Fault+Coverage+Model+With+Coverage+of+Irrelevant+Components&rft.jtitle=IEEE+transactions+on+reliability&rft.au=Jianwen+Xiang&rft.au=Machida%2C+Fumio&rft.au=Tadano%2C+Kumiko&rft.au=Maeno%2C+Yoshiharu&rft.date=2015-03-01&rft.pub=IEEE&rft.issn=0018-9529&rft.volume=64&rft.issue=1&rft.spage=320&rft.epage=332&rft_id=info:doi/10.1109%2FTR.2014.2363155&rft.externalDocID=6933956
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9529&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9529&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9529&client=summon