Lightweight Arc Fault Detection Method Based on Adam-Optimized Neural Network and Hardware Feature Algorithm - Chen, Wei; Han, Yi; Zhao, Jie; Chen, Chong; Zhang, Bin; Wu, Ziran; Lin, Zhenquan (Energies (Basel), 2024)
Keywords: Accuracy; Adam-optimizer; Algorithms; arc fault detection; Artificial intelligence; Field programmable gate arrays; Machine learning; Methods; Neural networks; series arc fault; Vacuum cleaners; China