Intermodulation electrostatic force microscopy for imaging surface photo-voltage
We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its resonance frequency. Frequency mixing due to the nonlinear ca...
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| Published in | Applied physics letters Vol. 105; no. 14; p. 143113 |
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| Main Authors | , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Melville
American Institute of Physics
06.10.2014
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| Subjects | |
| Online Access | Get full text |
| ISSN | 0003-6951 1077-3118 1077-3118 |
| DOI | 10.1063/1.4897966 |
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| Abstract | We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its resonance frequency. Frequency mixing due to the nonlinear capacitance gives intermodulation products of the two drive frequencies near the cantilever resonance, where they are measured with high signal to noise ratio. Analysis of this intermodulation response allows for quantitative reconstruction of the contact potential difference. We derive the theory of the method, validate it with numerical simulation and a control experiment, and we demonstrate its utility for fast imaging of the surface photo-voltage on an organic photo-voltaic material. |
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| AbstractList | We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its resonance frequency. Frequency mixing due to the nonlinear capacitance gives intermodulation products of the two drive frequencies near the cantilever resonance, where they are measured with high signal to noise ratio. Analysis of this intermodulation response allows for quantitative reconstruction of the contact potential difference. We derive the theory of the method, validate it with numerical simulation and a control experiment, and we demonstrate its utility for fast imaging of the surface photo-voltage on an organic photovoltaic material. We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its resonance frequency. Frequency mixing due to the nonlinear capacitance gives intermodulation products of the two drive frequencies near the cantilever resonance, where they are measured with high signal to noise ratio. Analysis of this intermodulation response allows for quantitative reconstruction of the contact potential difference. We derive the theory of the method, validate it with numerical simulation and a control experiment, and we demonstrate its utility for fast imaging of the surface photo-voltage on an organic photo-voltaic material. |
| Author | Borgani, Riccardo Thorén, Per-Anders Forchheimer, Daniel Bergqvist, Jonas Inganäs, Olle Haviland, David B. |
| Author_xml | – sequence: 1 givenname: Riccardo surname: Borgani fullname: Borgani, Riccardo – sequence: 2 givenname: Daniel surname: Forchheimer fullname: Forchheimer, Daniel – sequence: 3 givenname: Jonas surname: Bergqvist fullname: Bergqvist, Jonas – sequence: 4 givenname: Per-Anders surname: Thorén fullname: Thorén, Per-Anders – sequence: 5 givenname: Olle surname: Inganäs fullname: Inganäs, Olle – sequence: 6 givenname: David B. surname: Haviland fullname: Haviland, David B. |
| BackLink | https://www.osti.gov/biblio/22351135$$D View this record in Osti.gov https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-156990$$DView record from Swedish Publication Index https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-112649$$DView record from Swedish Publication Index |
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| SubjectTerms | Applied physics Atomic force microscopy CAPACITANCE Computer simulation COMPUTERIZED SIMULATION CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY Contact potentials ELECTRIC POTENTIAL ELECTRIC UTILITIES FREQUENCY MIXING GAS UTILITIES Imaging Intermodulation Microscopy NONLINEAR PROBLEMS PHOTOVOLTAIC EFFECT RESONANCE SIGNAL-TO-NOISE RATIO SURFACE POTENTIAL SURFACES |
| Title | Intermodulation electrostatic force microscopy for imaging surface photo-voltage |
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