Young's modulus of ZnO microwires determined by various mechanical measurement methods

The mechanical properties of ZnO microwires have been studied using three different methods: quasi-static flexural measurements using atomic force microscopy, static measurements using a nano indenter, and dynamic flexural measurements using optical interferometry. ZnO microwires were synthesized by...

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Published inCurrent applied physics Vol. 14; no. 2; pp. 166 - 170
Main Authors Kim, Hakseong, Jung, Un Seok, Kim, Soo In, Yoon, Duhee, Cheong, Hyeonsik, Lee, Chang Woo, Lee, Sang Wook
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.02.2014
한국물리학회
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ISSN1567-1739
1878-1675
DOI10.1016/j.cap.2013.10.018

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Abstract The mechanical properties of ZnO microwires have been studied using three different methods: quasi-static flexural measurements using atomic force microscopy, static measurements using a nano indenter, and dynamic flexural measurements using optical interferometry. ZnO microwires were synthesized by chemical vapor deposition method, and the crystal structure and quality were examined using x-ray diffraction and photoluminescence spectroscopy. The Young's moduli were estimated using the measurement results from the three methods, and they showed consistent values in the range 67.5–79.4 GPa for microwires with diameters of 1.8 μm ± 100 nm. •We synthesized high quality ZnO microwires and characterized by X-ray diffraction, photoluminescence spectroscopy.•Three different mechanical measurement methods have been executed to the same batch of ZnO microwires.•A consistent Young's modulus value was obtained by different modelings according to each measurements.
AbstractList The mechanical properties of ZnO microwires have been studied using three different methods: quasi-static flexural measurements using atomic force microscopy, static measurements using a nano indenter, and dynamic flexural measurements using optical interferometry. ZnO microwires were synthesized by chemical vapor deposition method, and the crystal structure and quality were examined using x-ray diffraction and photoluminescence spectroscopy. The Young's moduli were estimated using the measurement results from the three methods, and they showed consistent values in the range 67.5-79.4 GPa for microwires with diameters of 1.8 mu m plus or minus 100 nm.
The mechanical properties of ZnO microwires have been studied using three different methods: quasistatic flexural measurements using atomic force microscopy, static measurements using a nano indenter, and dynamic flexural measurements using optical interferometry. ZnO microwires were synthesized by chemical vapor deposition method, and the crystal structure and quality were examined using x-ray diffraction and photoluminescence spectroscopy. The Young’s moduli were estimated using the measurement results from the three methods, and they showed consistent values in the range 67.5e79.4 GPa for microwires with diameters of 1.8 mm 100 nm. KCI Citation Count: 9
The mechanical properties of ZnO microwires have been studied using three different methods: quasi-static flexural measurements using atomic force microscopy, static measurements using a nano indenter, and dynamic flexural measurements using optical interferometry. ZnO microwires were synthesized by chemical vapor deposition method, and the crystal structure and quality were examined using x-ray diffraction and photoluminescence spectroscopy. The Young's moduli were estimated using the measurement results from the three methods, and they showed consistent values in the range 67.5–79.4 GPa for microwires with diameters of 1.8 μm ± 100 nm. •We synthesized high quality ZnO microwires and characterized by X-ray diffraction, photoluminescence spectroscopy.•Three different mechanical measurement methods have been executed to the same batch of ZnO microwires.•A consistent Young's modulus value was obtained by different modelings according to each measurements.
Author Lee, Chang Woo
Jung, Un Seok
Lee, Sang Wook
Yoon, Duhee
Cheong, Hyeonsik
Kim, Soo In
Kim, Hakseong
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  givenname: Sang Wook
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  email: leesw@konkuk.ac.kr
  organization: Division of Quantum Phases and Devices, School of Physics, Konkuk University, 120 Neungdong-ro, Kwangjin-Gu, Seoul 143-701, Republic of Korea
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Issue 2
Keywords Young's modulus
Optical interferometry
Atomic force microscope
Nano indentation
ZnO microwire
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Snippet The mechanical properties of ZnO microwires have been studied using three different methods: quasi-static flexural measurements using atomic force microscopy,...
The mechanical properties of ZnO microwires have been studied using three different methods: quasistatic flexural measurements using atomic force microscopy,...
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SubjectTerms Atomic force microscope
Chemical vapor deposition
Diffraction
Dynamic tests
Indenters
Mechanical measurement
Modulus of elasticity
Nano indentation
Nanostructure
Optical interferometry
Young's modulus
Zinc oxide
ZnO microwire
물리학
Title Young's modulus of ZnO microwires determined by various mechanical measurement methods
URI https://dx.doi.org/10.1016/j.cap.2013.10.018
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