Teodoro, P. E., Teodoro, L. P. R., Baio, F. H. R., da Silva Junior, C. A., dos Santos, R. G., Ramos, A. P. M., . . . Shiratsuchi, L. S. (2021). Predicting Days to Maturity, Plant Height, and Grain Yield in Soybean: A Machine and Deep Learning Approach Using Multispectral Data. Remote sensing (Basel, Switzerland), 13(22), 4632. https://doi.org/10.3390/rs13224632
Chicago Style (17th ed.) CitationTeodoro, Paulo Eduardo, et al. "Predicting Days to Maturity, Plant Height, and Grain Yield in Soybean: A Machine and Deep Learning Approach Using Multispectral Data." Remote Sensing (Basel, Switzerland) 13, no. 22 (2021): 4632. https://doi.org/10.3390/rs13224632.
MLA (9th ed.) CitationTeodoro, Paulo Eduardo, et al. "Predicting Days to Maturity, Plant Height, and Grain Yield in Soybean: A Machine and Deep Learning Approach Using Multispectral Data." Remote Sensing (Basel, Switzerland), vol. 13, no. 22, 2021, p. 4632, https://doi.org/10.3390/rs13224632.