Experimental characterization of rolled annealed copper film used in flexible printed circuit boards: Identification of the elastic-plastic and low-cycle fatigue behaviors

The elastic-plastic and low-cycle fatigue behaviors of copper films are studied experimentally and identified for further simulation works. A rolled annealed copper grade is considered here, as it is often used in flexible printed circuit boards for its mechanical resistance to high elongations. Dur...

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Published inMicroelectronics and reliability Vol. 115; p. 113976
Main Authors Girard, Gautier, Martiny, Marion, Mercier, Sébastien
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.12.2020
Elsevier
Subjects
Online AccessGet full text
ISSN0026-2714
1872-941X
DOI10.1016/j.microrel.2020.113976

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Abstract The elastic-plastic and low-cycle fatigue behaviors of copper films are studied experimentally and identified for further simulation works. A rolled annealed copper grade is considered here, as it is often used in flexible printed circuit boards for its mechanical resistance to high elongations. During operation, the printed circuit board (PCB) will undergo various loadings, whether purely mechanical or environmental. These loadings can lead to the fracture of copper and thus to the disconnection of the electrical signal in the PCB. Copper has a low yield stress, so it undergoes easily plastic deformation. In the present work, a predominant kinematic hardening has been observed experimentally and modeled with the combined hardening model of Lemaitre-Chaboche. The fatigue behavior has been identified on cyclic loadings at different strain amplitudes. A Coffin-Manson model has been adopted to reproduce experimental data. Identified behaviors have been introduced in a numerical simulation of a flexible PCB under cyclic bending/reverse bending, in order to estimate its mechanical reliability. •Cyclic tension-compression response of rolled-annealed copper foil is captured•Kinematic hardening of copper is identified and modeled by a Chaboche approach•An original setup is developed to study the low-cycle fatigue of a copper foil•A low-cycle fatigue model is identified from tests with various strain amplitudes•The lifetime of a flexible PCB under cyclic folding is assessed via a FE simulation
AbstractList The elastic-plastic and low-cycle fatigue behaviors of copper films are studied experimentally and identified for further simulation works. A rolled annealed copper grade is considered here, as it is often used in flexible printed circuit boards for its mechanical resistance to high elongations. During operation, the printed circuit board (PCB) will undergo various loadings, whether purely mechanical or environmental. These loadings can lead to the fracture of copper and thus to the disconnection of the electrical signal in the PCB. Copper has a low yield stress, so it undergoes easily plastic deformation. In the present work, a predominant kinematic hardening has been observed experimentally and modeled with the combined hardening model of Lemaitre-Chaboche. The fatigue behavior has been identified on cyclic loadings at different strain amplitudes. A Coffin-Manson model has been adopted to reproduce experimental data. Identified behaviors have been introduced in a numerical simulation of a flexible PCB under cyclic bending/reverse bending, in order to estimate its mechanical reliability.
The elastic-plastic and low-cycle fatigue behaviors of copper films are studied experimentally and identified for further simulation works. A rolled annealed copper grade is considered here, as it is often used in flexible printed circuit boards for its mechanical resistance to high elongations. During operation, the printed circuit board (PCB) will undergo various loadings, whether purely mechanical or environmental. These loadings can lead to the fracture of copper and thus to the disconnection of the electrical signal in the PCB. Copper has a low yield stress, so it undergoes easily plastic deformation. In the present work, a predominant kinematic hardening has been observed experimentally and modeled with the combined hardening model of Lemaitre-Chaboche. The fatigue behavior has been identified on cyclic loadings at different strain amplitudes. A Coffin-Manson model has been adopted to reproduce experimental data. Identified behaviors have been introduced in a numerical simulation of a flexible PCB under cyclic bending/reverse bending, in order to estimate its mechanical reliability. •Cyclic tension-compression response of rolled-annealed copper foil is captured•Kinematic hardening of copper is identified and modeled by a Chaboche approach•An original setup is developed to study the low-cycle fatigue of a copper foil•A low-cycle fatigue model is identified from tests with various strain amplitudes•The lifetime of a flexible PCB under cyclic folding is assessed via a FE simulation
ArticleNumber 113976
Author Mercier, Sébastien
Girard, Gautier
Martiny, Marion
Author_xml – sequence: 1
  givenname: Gautier
  surname: Girard
  fullname: Girard, Gautier
  email: gautier.girard@univ-lorraine.fr
– sequence: 2
  givenname: Marion
  surname: Martiny
  fullname: Martiny, Marion
– sequence: 3
  givenname: Sébastien
  surname: Mercier
  fullname: Mercier, Sébastien
BackLink https://hal.science/hal-03008248$$DView record in HAL
BookMark eNqFUctuUzEQtVCRSAu_gLxlcYPt-0YsqKpCK0ViAxI7y9cek4kcO7Kd0PJL_CS-vS0LNl3N6Og8NHPOyZkPHgh5y9maM9693633qGOI4NaCiQLyeuy7F2TFh15UY8N_nJEVY6KrRM-bV-Q8pR1jrGecr8if67sDRNyDz8pRvVVR6VyA3ypj8DRYGoNzYKjyHtS86HAoCmrR7ekxFQA9tQ7ucHJADxF9nkkY9REznYKKJn2gt6YEoEX9zzZvgYJTKaOuDsssGYa68KvS97p42cL9eQQ6wVadMMT0mry0yiV48zgvyPfP19-ubqrN1y-3V5ebStdjk6vRNH0_tjVA22utW2MHPbRDYwXruraDTgnbghl6bmsQvJ2GmsNo-dSymrNxqC_Iu8V3q5wsF-1VvJdBoby53MgZYzVjg2iGEy_cjwu3NJBSBCs15ocjc1ToJGdyLknu5FNJci5JLiUVefef_CnvWeGnRQjlESeEKJNG8BoMRtBZmoDPWfwFDU-2pQ
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ContentType Journal Article
Copyright 2020 Elsevier Ltd
Distributed under a Creative Commons Attribution 4.0 International License
Copyright_xml – notice: 2020 Elsevier Ltd
– notice: Distributed under a Creative Commons Attribution 4.0 International License
DBID AAYXX
CITATION
1XC
VOOES
DOI 10.1016/j.microrel.2020.113976
DatabaseName CrossRef
Hyper Article en Ligne (HAL)
Hyper Article en Ligne (HAL) (Open Access)
DatabaseTitle CrossRef
DatabaseTitleList

DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1872-941X
ExternalDocumentID oai_HAL_hal_03008248v1
10_1016_j_microrel_2020_113976
S0026271420308076
GroupedDBID --K
--M
.DC
.~1
0R~
123
1B1
1~.
1~5
29M
4.4
457
4G.
5VS
7-5
71M
8P~
9JN
AABNK
AABXZ
AACTN
AAEDT
AAEDW
AAEPC
AAIAV
AAIKJ
AAKOC
AALRI
AAOAW
AAQFI
AAQXK
AAXUO
AAYFN
ABBOA
ABFNM
ABFRF
ABJNI
ABMAC
ABXDB
ABXRA
ABYKQ
ACDAQ
ACGFS
ACNNM
ACRLP
ACZNC
ADBBV
ADEZE
ADJOM
ADMUD
ADTZH
AEBSH
AECPX
AEFWE
AEKER
AENEX
AEZYN
AFKWA
AFRZQ
AFTJW
AGHFR
AGUBO
AGYEJ
AHHHB
AHJVU
AHZHX
AIALX
AIEXJ
AIKHN
AITUG
AJBFU
AJOXV
ALMA_UNASSIGNED_HOLDINGS
AMFUW
AMRAJ
AOUOD
AXJTR
AZFZN
BJAXD
BKOJK
BLXMC
CS3
DU5
EBS
EFJIC
EFLBG
EJD
EO8
EO9
EP2
EP3
F5P
FDB
FEDTE
FGOYB
FIRID
FNPLU
FYGXN
G-2
G-Q
GBLVA
GBOLZ
HVGLF
HZ~
IHE
J1W
JJJVA
KOM
LY7
M41
MAGPM
MO0
N9A
O-L
O9-
OAUVE
OZT
P-8
P-9
P2P
PC.
Q38
R2-
RIG
RNS
ROL
RPZ
RXW
SDF
SDG
SES
SET
SEW
SPC
SPCBC
SPD
SSM
SST
SSV
SSZ
T5K
T9H
TAE
UHS
UNMZH
WUQ
XOL
ZMT
~G-
AATTM
AAXKI
AAYWO
AAYXX
ABWVN
ACLOT
ACRPL
ACVFH
ADCNI
ADNMO
AEIPS
AEUPX
AFJKZ
AFPUW
AGQPQ
AIGII
AIIUN
AKBMS
AKRWK
AKYEP
ANKPU
APXCP
CITATION
EFKBS
~HD
1XC
AGCQF
VOOES
ID FETCH-LOGICAL-c394t-9d477953ee57ccc5df8c8584f206656e6a2f5ed871f3e215b831e9f1b50310983
IEDL.DBID .~1
ISSN 0026-2714
IngestDate Fri Sep 12 12:38:58 EDT 2025
Thu Sep 25 00:32:05 EDT 2025
Thu Apr 24 22:56:17 EDT 2025
Fri Feb 23 02:46:12 EST 2024
IsDoiOpenAccess true
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Keywords Printed circuit boards
Mechanical tests
Elastic-plastic behavior
Kinematic hardening
Copper film
Low-cycle fatigue
Language English
License Distributed under a Creative Commons Attribution 4.0 International License: http://creativecommons.org/licenses/by/4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c394t-9d477953ee57ccc5df8c8584f206656e6a2f5ed871f3e215b831e9f1b50310983
ORCID 0000-0002-7126-4164
0000-0002-5640-3306
OpenAccessLink https://hal.science/hal-03008248
ParticipantIDs hal_primary_oai_HAL_hal_03008248v1
crossref_citationtrail_10_1016_j_microrel_2020_113976
crossref_primary_10_1016_j_microrel_2020_113976
elsevier_sciencedirect_doi_10_1016_j_microrel_2020_113976
PublicationCentury 2000
PublicationDate 2020-12-01
PublicationDateYYYYMMDD 2020-12-01
PublicationDate_xml – month: 12
  year: 2020
  text: 2020-12-01
  day: 01
PublicationDecade 2020
PublicationTitle Microelectronics and reliability
PublicationYear 2020
Publisher Elsevier Ltd
Elsevier
Publisher_xml – name: Elsevier Ltd
– name: Elsevier
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SSID ssj0007011
Score 2.3899083
Snippet The elastic-plastic and low-cycle fatigue behaviors of copper films are studied experimentally and identified for further simulation works. A rolled annealed...
SourceID hal
crossref
elsevier
SourceType Open Access Repository
Enrichment Source
Index Database
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StartPage 113976
SubjectTerms Copper film
Elastic-plastic behavior
Electronics
Engineering Sciences
Kinematic hardening
Low-cycle fatigue
Mechanical tests
Mechanics
Mechanics of materials
Printed circuit boards
Title Experimental characterization of rolled annealed copper film used in flexible printed circuit boards: Identification of the elastic-plastic and low-cycle fatigue behaviors
URI https://dx.doi.org/10.1016/j.microrel.2020.113976
https://hal.science/hal-03008248
Volume 115
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVESC
  databaseName: Baden-Württemberg Complete Freedom Collection (Elsevier)
  customDbUrl:
  eissn: 1872-941X
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0007011
  issn: 0026-2714
  databaseCode: GBLVA
  dateStart: 20110101
  isFulltext: true
  titleUrlDefault: https://www.sciencedirect.com
  providerName: Elsevier
– providerCode: PRVESC
  databaseName: Elsevier Freedom Collection
  customDbUrl:
  eissn: 1872-941X
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0007011
  issn: 0026-2714
  databaseCode: ACRLP
  dateStart: 19950101
  isFulltext: true
  titleUrlDefault: https://www.sciencedirect.com
  providerName: Elsevier
– providerCode: PRVESC
  databaseName: Elsevier SD Freedom Collection Journals [SCFCJ]
  customDbUrl:
  eissn: 1872-941X
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0007011
  issn: 0026-2714
  databaseCode: AIKHN
  dateStart: 19950101
  isFulltext: true
  titleUrlDefault: https://www.sciencedirect.com
  providerName: Elsevier
– providerCode: PRVESC
  databaseName: ScienceDirect Freedom Collection 2013
  customDbUrl:
  eissn: 1872-941X
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0007011
  issn: 0026-2714
  databaseCode: .~1
  dateStart: 19950101
  isFulltext: true
  titleUrlDefault: https://www.sciencedirect.com
  providerName: Elsevier
– providerCode: PRVLSH
  databaseName: Elsevier Journals
  customDbUrl:
  mediaType: online
  eissn: 1872-941X
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0007011
  issn: 0026-2714
  databaseCode: AKRWK
  dateStart: 19620101
  isFulltext: true
  providerName: Library Specific Holdings
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1Lb9swDBay9tIdiq3rsLZbIBS9KollyY_dgqJF-sppAXIzrNfmIo2D1GnRS__Q_uRIy84yYEAOPdkWREswCYqkyY-EnCWRdDJwmgknJROhcEzlijOQH54HSpiBQUfxbhyNJuJ6Kqcdct7WwmBaZaP7vU6vtXUz0m--Zn9RFFjjyyMeB4Ij5Aq441jBLiJM6-u9_k3ziAeB75rHI4azN6qE73sPmPS2tPgLgtftTVLEHvn_AfXuVxtqrY-eyw9kv7EZ6dBv6yPp2PkBeb-BJPiJ_L7YQOqneo3C7IssaenoEiMEhuagV3O80eUCKKgrZg909QgDxZw6RMdUM0sx2lfhpGKpV0VFVYm1Wd-pL-t1TZwPXwv2I7VggcPW2MJfYQ1DZ-Uz0y-wXepg7s-VpS0gwOMhmVxe_DgfsaYPA9NhKiqWGhHHqQytlbHWWhqX6AQMF4dQ8DKyUc6dtAZcLxdaMCFUEgY2dYGSNe5oEn4mO_Nybr8QmoJJocDFAa0gRazi3AQCXRxuXGxDLY6IbD9-phuQcuyVMcvabLT7rGVahkzLPNOOSH9Nt_AwHVsp0pa32T8Cl8FZspX2FIRhvRAidI-GtxmOgSyCUSWSp-D4DQuckD188mkzX8lOtVzZb2D8VKpbS3eX7A6vbkbjPy_NBu0
linkProvider Elsevier
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1Lb9swDCba9LDtMOyJdU9h2FVLLUt-7BYULdw1zakFehOs1-YijYPU2bDftD85MrKDDBjQw042ZNMSRIIiafIjwKciU0ElwXIZlOIylYGb2giO8iPqxEh35MhRvJhl1ZX8eq2u9-B4qIWhtMpe90edvtHW_ci4383xsmmoxldkIk-kIMgVdMf34UAq1MkjOJicnVezrULOj5LYOE9knAh2CoVvPt9S3tvK018IselwUhL8yL_PqP3vQ7R1c_qcPoHHvdnIJnFlT2HPL57Box0wwefw-2QHrJ_ZLRBzrLNkbWArChI4VqNqrenGtkukYKGZ37L1HQ40CxYIINPMPaOAX0cvNSu7bjpmWirP-sJiZW_oQ330WTQhmUcjHJfGl_GKczg2b39y-wuXywK--23t2YAJcPcCrk5PLo8r3rdi4DYtZcdLJ_O8VKn3KrfWKhcKW6DtEggNXmU-q0VQ3qH3FVKPVoQp0sSXITFqAz1apC9htGgX_hWwEq0Kg14OKgYlc5PXLpHk5QgXcp9aeQhq2Hxte5xyapcx10NC2o0emKaJaToy7RDGW7plROq4l6IceKv_kjmNx8m9tB9RGLYTEUh3NZlqGkNxRLtKFj-S1_8xwQd4UF1eTPX0bHb-Bh7Sk5hF8xZG3Wrt36Et1Jn3vaz_ARCbCZg
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Experimental+characterization+of+rolled+annealed+copper+film+used+in+flexible+printed+circuit+boards%3A+Identification+of+the+elastic-plastic+and+low-cycle+fatigue+behaviors&rft.jtitle=Microelectronics+and+reliability&rft.au=Girard%2C+Gautier&rft.au=Martiny%2C+Marion&rft.au=Mercier%2C+S%C3%A9bastien&rft.date=2020-12-01&rft.issn=0026-2714&rft.volume=115&rft.spage=113976&rft_id=info:doi/10.1016%2Fj.microrel.2020.113976&rft.externalDBID=n%2Fa&rft.externalDocID=10_1016_j_microrel_2020_113976
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0026-2714&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0026-2714&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0026-2714&client=summon