Huang, Y., & Hsieh, T. (2015). Effective thermal parameters of chalcogenide thin films and simulation of phase-change memory. International journal of thermal sciences, 87, 207-214. https://doi.org/10.1016/j.ijthermalsci.2014.08.004
Chicago Style (17th ed.) CitationHuang, Yin-Hsien, and Tsung-Eong Hsieh. "Effective Thermal Parameters of Chalcogenide Thin Films and Simulation of Phase-change Memory." International Journal of Thermal Sciences 87 (2015): 207-214. https://doi.org/10.1016/j.ijthermalsci.2014.08.004.
MLA (9th ed.) CitationHuang, Yin-Hsien, and Tsung-Eong Hsieh. "Effective Thermal Parameters of Chalcogenide Thin Films and Simulation of Phase-change Memory." International Journal of Thermal Sciences, vol. 87, 2015, pp. 207-214, https://doi.org/10.1016/j.ijthermalsci.2014.08.004.