Characterization of small single photon avalanche diode fabricated using standard 180 nm CMOS process for digital SiPM - Oh, Jinseok; Jeong, Hakcheon; Lee, Min Sun; Kwon, Inyong (Nuclear engineering and technology, 2024)
Keywords: Breakdown voltage; Dark count rate (DCR); Depletion region; Guard ring; On-chip sensor; Photon detection probability (PDP); Premature edge breakdown (PEB); Single photon avalanche diodes (SPADs); Standard CMOS; 원자력공학; Breakdown voltage; Guard ring; Single photon avalanche diodes (SPADs); Depletion region; Standard CMOS; Premature edge breakdown (PEB); Dark count rate (DCR); On-chip sensor; Photon detection probability (PDP)