孙永姝, 赵. 岳. 赵. 陆. 边. 王. (2015). Single event soft error in advanced integrated circuit. Journal of semiconductors, 36(11), 1-14. https://doi.org/10.1088/1674-4926/36/11/111001
Chicago Style (17th ed.) Citation孙永姝, 赵元富 岳素格 赵馨远 陆时进 边强 王亮. "Single Event Soft Error in Advanced Integrated Circuit." Journal of Semiconductors 36, no. 11 (2015): 1-14. https://doi.org/10.1088/1674-4926/36/11/111001.
MLA (9th ed.) Citation孙永姝, 赵元富 岳素格 赵馨远 陆时进 边强 王亮. "Single Event Soft Error in Advanced Integrated Circuit." Journal of Semiconductors, vol. 36, no. 11, 2015, pp. 1-14, https://doi.org/10.1088/1674-4926/36/11/111001.
Warning: These citations may not always be 100% accurate.