Modeling and simulation of single-event effect in CMOS circuit - 岳素格 张晓林 赵元富 刘琳 王汉宁 (Journal of semiconductors, 2015)
Keywords: Charge; charge collection; CMOS电路; Computer simulation; Devices; Ionization; Modelling; multi-node upset (MNU); Production methods; Semiconductors; single event effect (SEE); single event upset (SEU); Soft errors; 仿真建模; 半导体器件; 单粒子效应; 双极晶体管; 模拟方法; 电离辐射; 集成电路