Experimental Characterization of Radiation-Induced Charge Sharing

• Published in: IEEE transactions on nuclear science Vol. 60; no. 6; pp. 4159 - 4165
• Main Authors: Bennett, William G., Hooten, Nicholas C., Schrimpf, Ronald D., Reed, Robert A., Weller, Robert A., Mendenhall, Marcus H., Witulski, Arthur F., Wilkes, D. Mitchell
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.12.2013; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Adjacent nodes; Charge; charge collection; Charge measurement; charge sharing; Collection; Current carriers; Current measurement; Depletion; drift transport; fast transient; heavy-ion; Junctions; laser testing; Lasers; Monte-Carlo radiation transport code; MRED; multi-node charge collection; multiple node charge collection; scaling; SEE; Semiconductor device measurement; SET; Single event transients; single-event effects; single-event transient; Strikes; TPA; Transient analysis; Transient current; two-photon absorption; Waveforms
• ISSN: 0018-9499; 1558-1578
• DOI: 10.1109/TNS.2013.2286701

Charge collection by multiple junctions is investigated using broadbeam heavy-ion and backside laser current transient measurements. The probability that significant charge is collected by more than one junction is greater for laser-generated events compared to heavy-ion measurements, which is attributed to the larger carrier generation track radius for the laser. With both sources, the probability of collecting charge on multiple junctions saturates at high charge generation levels. Effects caused by the interaction between junctions on the transient current waveforms is determined using position-correlated two-photon absorption laser analysis. The total charge collected for ion strikes between four adjacent junctions is shown to be approximately the same as for a direct strikes on a single junction, even though the incident ion does not pass through the depletion region of a biased junction.