Boamah, M. D., Ohno, P. E., Geiger, F. M., & Eisenthal, K. B. (2018). Relative permittivity in the electrical double layer from nonlinear optics. The Journal of chemical physics, 148(22), 222808-222814. https://doi.org/10.1063/1.5011977
Chicago Style (17th ed.) CitationBoamah, Mavis D., Paul E. Ohno, Franz M. Geiger, and Kenneth B. Eisenthal. "Relative Permittivity in the Electrical Double Layer from Nonlinear Optics." The Journal of Chemical Physics 148, no. 22 (2018): 222808-222814. https://doi.org/10.1063/1.5011977.
MLA (9th ed.) CitationBoamah, Mavis D., et al. "Relative Permittivity in the Electrical Double Layer from Nonlinear Optics." The Journal of Chemical Physics, vol. 148, no. 22, 2018, pp. 222808-222814, https://doi.org/10.1063/1.5011977.
Warning: These citations may not always be 100% accurate.