Finite-Element Model for Simulation of Ferrite-Core Eddy-Current Probe
The finite-element method is widely used in modeling eddy-current phenomena. However, its application in eddy-current nondestructive testing involving probe motion requires remeshing for each coil position. Remeshing is not only cumbersome but also a major source of computational noise. We have used...
Saved in:
Published in | IEEE transactions on magnetics Vol. 46; no. 3; pp. 905 - 909 |
---|---|
Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
New York, NY
IEEE
01.03.2010
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
ISSN | 0018-9464 1941-0069 |
DOI | 10.1109/TMAG.2009.2034651 |
Cover
Abstract | The finite-element method is widely used in modeling eddy-current phenomena. However, its application in eddy-current nondestructive testing involving probe motion requires remeshing for each coil position. Remeshing is not only cumbersome but also a major source of computational noise. We have used the reduced magnetic vector potential formulation to model an air-core probe scan without remeshing the coil in different positions. In this paper, we present a method to model the scanning of ferrite-core probe. With this method, finite-element meshes for the test sample and the ferrite core are generated separately. The coil is not meshed. The magnetic field and magnetic vector potential due to the coil are evaluated analytically. An iterative but fast procedure is used to update the total field. The method is simple, flexible, accurate, and efficient. |
---|---|
AbstractList | The finite-element method is widely used in modeling eddy-current phenomena. However, its application in eddy-current nondestructive testing involving probe motion requires remeshing for each coil position. Remeshing is not only cumbersome but also a major source of computational noise. We have used the reduced magnetic vector potential formulation to model an air-core probe scan without remeshing the coil in different positions. In this paper, we present a method to model the scanning of ferrite-core probe. With this method, finite-element meshes for the test sample and the ferrite core are generated separately. The coil is not meshed. The magnetic field and magnetic vector potential due to the coil are evaluated analytically. An iterative but fast procedure is used to update the total field. The method is simple, flexible, accurate, and efficient. |
Author | Zeng, Zhiwei Udpa, Lalita Udpa, Satish S. |
Author_xml | – sequence: 1 givenname: Zhiwei surname: Zeng fullname: Zeng, Zhiwei email: zeng@zmu.edu.cn organization: $^{1}$Department of Aeronautics, Xiamen University, Xiamen, Fujian, China – sequence: 2 givenname: Lalita surname: Udpa fullname: Udpa, Lalita organization: $^{2}$ Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MO, USA – sequence: 3 givenname: Satish S. surname: Udpa fullname: Udpa, Satish S. organization: Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MO, USA |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=22492758$$DView record in Pascal Francis |
BookMark | eNqFkU1r3DAQhkVJoZu0P6D0YgolJyejb-kYlt2kkJBA0rPQWiNQ8FqpZB_y72t3lxxyaC8aBM8jzcx7Sk6GPCAhXylcUAr28unu6vqCAdj54EJJ-oGsqBW0BVD2hKwAqGmtUOITOa31eb4KSWFFtts0pBHbTY97HMbmLgfsm5hL85j2U-_HlIcmx2aLpSzcOhdsNiG8tuuplMV4KHmHn8nH6PuKX471jPzabp7WN-3t_fXP9dVt23GjxhZB210wxoZgvA6ANNiotLLCeq5YlEKZICMC2k5z6DyjQHkUPIbAxM7wM3J-ePel5N8T1tHtU-2w7_2AearOaAmMccH-S2rBlZZa6Zn8_o58zlMZ5jGcpdoyrYycoR9HyNfO97H4oUvVvZS09-XVMSZmUC4N0gPXlVxrwfiGUHBLUm5Jyi1JuWNSs6PfOV0a_25-LD71_zS_HcyEiG8_SQ6KzvP9AfQUoAw |
CODEN | IEMGAQ |
CitedBy_id | crossref_primary_10_1115_1_4044446 crossref_primary_10_3390_math8020201 crossref_primary_10_1016_j_asoc_2016_10_027 crossref_primary_10_1109_JSEN_2018_2829705 crossref_primary_10_1109_TMAG_2010_2102770 crossref_primary_10_3390_app15031420 crossref_primary_10_1016_j_sna_2022_114084 crossref_primary_10_1080_10589759_2020_1714614 crossref_primary_10_1109_TMAG_2012_2186311 crossref_primary_10_1080_10589759_2023_2198234 crossref_primary_10_1080_10589759_2022_2077939 crossref_primary_10_1108_COMPEL_11_2013_0370 crossref_primary_10_1016_j_asoc_2020_106541 crossref_primary_10_1109_TMAG_2011_2108996 crossref_primary_10_1016_j_jmmm_2023_171147 crossref_primary_10_1109_TMAG_2012_2206397 crossref_primary_10_1016_j_measurement_2024_116410 crossref_primary_10_1080_10589759_2012_740040 crossref_primary_10_1002_jnm_1929 crossref_primary_10_1038_s41598_023_32319_8 crossref_primary_10_1109_JSEN_2019_2919661 crossref_primary_10_1016_j_asoc_2018_04_045 crossref_primary_10_1631_FITEE_1500212 crossref_primary_10_1109_TMAG_2015_2450194 crossref_primary_10_3233_JAE_162219 crossref_primary_10_1016_j_ndteint_2016_11_007 crossref_primary_10_3233_JAE_209391 crossref_primary_10_1016_j_ndteint_2015_07_001 crossref_primary_10_1016_j_compstruct_2022_116378 crossref_primary_10_1109_JSEN_2016_2556221 crossref_primary_10_1109_TMAG_2015_2390144 crossref_primary_10_1016_j_ndteint_2012_12_002 crossref_primary_10_1016_j_ndteint_2012_12_001 |
Cites_doi | 10.1016/S0045-7825(98)00165-0 10.1109/TMAG.1983.1062743 10.1109/TMAG.2007.892507 10.1109/TMAG.2006.880997 10.1520/JTE10129J 10.1109/20.34388 10.1109/TMAG.2007.892398 |
ContentType | Journal Article |
Copyright | 2015 INIST-CNRS Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Mar 2010 |
Copyright_xml | – notice: 2015 INIST-CNRS – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Mar 2010 |
DBID | 97E RIA RIE AAYXX CITATION IQODW 7SP 7U5 8BQ 8FD JG9 L7M F28 FR3 |
DOI | 10.1109/TMAG.2009.2034651 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef Pascal-Francis Electronics & Communications Abstracts Solid State and Superconductivity Abstracts METADEX Technology Research Database Materials Research Database Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering Engineering Research Database |
DatabaseTitle | CrossRef Materials Research Database Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace METADEX Electronics & Communications Abstracts Engineering Research Database ANTE: Abstracts in New Technology & Engineering |
DatabaseTitleList | Materials Research Database Materials Research Database Materials Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics |
EISSN | 1941-0069 |
EndPage | 909 |
ExternalDocumentID | 2570859961 22492758 10_1109_TMAG_2009_2034651 5306174 |
Genre | orig-research |
GroupedDBID | -~X 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACGFS ACIWK ACNCT AENEX AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 IAAWW IBMZZ ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P RIA RIE RNS TN5 TWZ VH1 VJK XXG AAYXX CITATION IQODW RIG 7SP 7U5 8BQ 8FD JG9 L7M F28 FR3 |
ID | FETCH-LOGICAL-c386t-e079bd889dd8a7d0e1d9f676949a362f5468d5fe0e9c730ca21013f43fdd24b83 |
IEDL.DBID | RIE |
ISSN | 0018-9464 |
IngestDate | Sun Sep 28 12:32:54 EDT 2025 Sun Sep 28 10:39:08 EDT 2025 Mon Jun 30 10:25:31 EDT 2025 Mon Jul 21 09:13:12 EDT 2025 Thu Apr 24 22:54:17 EDT 2025 Wed Oct 01 00:48:29 EDT 2025 Wed Aug 27 02:40:18 EDT 2025 |
IsPeerReviewed | false |
IsScholarly | true |
Issue | 3 |
Keywords | reduced magnetic vector potential ferrite core Finite element method Ferrite Potentials Simulation Mathematical models Modelling Eddy-current testing Eddy currents finite-element method (FEM) Eddy current testing Magnetic properties |
Language | English |
License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html CC BY 4.0 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c386t-e079bd889dd8a7d0e1d9f676949a362f5468d5fe0e9c730ca21013f43fdd24b83 |
Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 ObjectType-Article-2 ObjectType-Feature-1 content type line 23 |
PQID | 917927685 |
PQPubID | 23500 |
PageCount | 5 |
ParticipantIDs | pascalfrancis_primary_22492758 crossref_primary_10_1109_TMAG_2009_2034651 proquest_journals_917927685 crossref_citationtrail_10_1109_TMAG_2009_2034651 proquest_miscellaneous_743675767 ieee_primary_5306174 proquest_miscellaneous_875022342 |
ProviderPackageCode | CITATION AAYXX |
PublicationCentury | 2000 |
PublicationDate | 2010-03-01 |
PublicationDateYYYYMMDD | 2010-03-01 |
PublicationDate_xml | – month: 03 year: 2010 text: 2010-03-01 day: 01 |
PublicationDecade | 2010 |
PublicationPlace | New York, NY |
PublicationPlace_xml | – name: New York, NY – name: New York |
PublicationTitle | IEEE transactions on magnetics |
PublicationTitleAbbrev | TMAG |
PublicationYear | 2010 |
Publisher | IEEE Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: Institute of Electrical and Electronics Engineers – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref12 ref11 ida (ref7) 1983 ref10 zeng (ref13) 2007; 83 (ref1) 2004; 5 ref8 palanisamy (ref6) 1980 ref9 ref4 lord (ref3) 1979 ref5 yook (ref2) 1996 |
References_xml | – ident: ref9 doi: 10.1016/S0045-7825(98)00165-0 – ident: ref5 doi: 10.1109/TMAG.1983.1062743 – volume: 83 start-page: 35 year: 2007 ident: ref13 article-title: reduced magnetic vector potential and electric scalar potential formulation for eddy current modeling publication-title: Prz Elektrotech – year: 1983 ident: ref7 publication-title: Three Dimensional Finite Element Modeling of Electromagnetic NDT Phenomena – ident: ref10 doi: 10.1109/TMAG.2007.892507 – year: 1980 ident: ref6 publication-title: Finite Element Modeling of Eddy Current Nondestructive Testing Phenomena – ident: ref12 doi: 10.1109/TMAG.2006.880997 – volume: 5 start-page: 51 year: 2004 ident: ref1 publication-title: Nondestructive Testing Handbook – ident: ref4 doi: 10.1520/JTE10129J – year: 1979 ident: ref3 article-title: development of theoretical models for ndt eddy current phenomena publication-title: Proc Symp Eddy Curr Charact Mater Struct NBS – ident: ref8 doi: 10.1109/20.34388 – year: 1996 ident: ref2 publication-title: Electromagnetic Modeling of High-Speed High-Frequency Interconnects – ident: ref11 doi: 10.1109/TMAG.2007.892398 |
SSID | ssj0014510 |
Score | 2.1749725 |
Snippet | The finite-element method is widely used in modeling eddy-current phenomena. However, its application in eddy-current nondestructive testing involving probe... |
SourceID | proquest pascalfrancis crossref ieee |
SourceType | Aggregation Database Index Database Enrichment Source Publisher |
StartPage | 905 |
SubjectTerms | Coiling Coils Computational modeling Cross-disciplinary physics: materials science; rheology Eddy current testing Exact sciences and technology ferrite core Ferrites Finite element method Finite element methods finite-element method (FEM) Magnetic cores Magnetic fields Magnetic noise Magnetic separation Magnetic vector potentials Magnetism Materials science Mathematical analysis Mathematical models Nondestructive testing Other topics in materials science Physics Probes reduced magnetic vector potential |
Title | Finite-Element Model for Simulation of Ferrite-Core Eddy-Current Probe |
URI | https://ieeexplore.ieee.org/document/5306174 https://www.proquest.com/docview/917927685 https://www.proquest.com/docview/743675767 https://www.proquest.com/docview/875022342 |
Volume | 46 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
journalDatabaseRights | – providerCode: PRVIEE databaseName: IEEE Electronic Library (IEL) customDbUrl: eissn: 1941-0069 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0014510 issn: 0018-9464 databaseCode: RIE dateStart: 19650101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3faxQxEB7agqAPVlvFtbXkwSdxr9lNskkeS7m1CCeCLfRt2c0PKLZ34t09tH-9M5u9pbUqvi1klmQzSWZmZ_J9AO9Vp0XolMgJfS2X2rvctIbnRnHXOVV51eN0z75UZxfy86W63IKP412YEEJffBYm9Njn8v3CrelX2bESZHDlNmxrbdNdrTFjIFWRrpsUhmjj5ZDBLLg9Pp-dfErIlCUXxP39wAb1pCpUEtkucVZiorN4dDL35qbehdlmoKnK5Ptkveom7u43DMf__ZIX8HzwO9lJWigvYSvM9-DZPTTCPXjSV4O65T7U9RW5ovk01ZYzIky7Zujesm9XNwPfF1tEVhOsI8qdYvds6v3tBu6JfaVbRq_gop6en57lA-FC7oSpVnlAfXXeGOu9abXnofA2Ug2stC0auqhkZbyKgQfr8GRwLcaLhYhSRO9L2RnxGnbmi3l4A8zhAtCBy1iaFleARLcjFBa9BReFxj4y4BsVNG5AIydSjOumj0q4bUhrRJJpm0FrGXwYX_mRoDj-JbxPsz4KDhOewdEDPY_tJSEnYuyUwcFG8c2wm5cNhrTYWBmVARtbcRtSbqWdh8V62aAjhqGXrvTfRTAyRIdJyPLtn8d2AE9TaQIVuB3CzurnOrxDj2fVHfVL_RcIb_qb |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT9wwEB5RqqrlQAsUNdBSHzhVzeLEduIcEdp027IIqYvELUr8kFBht-ruHuDXMxNno0If6i2SJ7LjsT0zmfH3ARyqJheuUSIm9LVY5tbEutY81oqbxqjMqhane3yWjS7kl0t1uQYf-7swzrm2-MwN6LHN5duZWdKvsiMlyODKJ_BUYVSRh9tafc5AqiRcOEk0EcfLLoeZ8OJoMj7-FLApUy6I_fuBFWppVagosp7jvPhAaPHb2dwanPIljFdDDXUm3wfLRTMwd49QHP_3W17BZud5suOwVLZgzU23YeMXPMJteNbWg5r5DpTlFTmj8TBUlzOiTLtm6OCyb1c3HeMXm3lWErAjyp1g92xo7e0K8Imd0z2j13BRDicno7ijXIiN0NkidqixxmpdWKvr3HKX2MJTFawsajR1XslMW-Udd4XBs8HUGDEmwkvhrU1lo8UurE9nU_cGmMElkDsufaprXAMSHQ-XFOgvGC9y7CMCvlJBZTo8cqLFuK7auIQXFWmNaDKLqtNaBB_6V34EMI5_Ce_QrPeC3YRHcPBAz317StiJGD1FsL9SfNXt53mFQS02ZlpFwPpW3IiUXamnbracV-iKYfCVZ_nfRTA2RJdJyHTvz2N7D89Hk_Fpdfr57Os-vAiFClTu9hbWFz-X7h36P4vmoF3291aV_ew |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Finite-Element+Model+for+Simulation+of+Ferrite-Core+Eddy-Current+Probe&rft.jtitle=IEEE+transactions+on+magnetics&rft.au=Zeng%2C+Zhiwei&rft.au=Udpa%2C+Lalita&rft.au=Udpa%2C+Satish+S.&rft.date=2010-03-01&rft.pub=IEEE&rft.issn=0018-9464&rft.volume=46&rft.issue=3&rft.spage=905&rft.epage=909&rft_id=info:doi/10.1109%2FTMAG.2009.2034651&rft.externalDocID=5306174 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9464&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9464&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9464&client=summon |