A Fast Deep Learning Method for Security Vulnerability Study of XOR PUFs - Mursi, Khalid T.; Thapaliya, Bipana; Zhuang, Yu; Aseeri, Ahmad O.; Alkatheiri, Mohammed Saeed (Electronics (Basel), 2020)
Keywords: Accuracy; Computational efficiency; Computing time; Cryptography; Deep learning; Gates (circuits); Internet of Things; Machine learning; Methods; Neural networks; Support vector machines