Proton-induced radiation damage in germanium detectors - Bruckner, J.; Korfer, M.; Wanke, H.; Schroeder, A.N.F.; Filges, D.; Dragovitsch, P.; Englert, P.A.J.; Starr, R.; Trombka, J.I.; Taylor, I.; Drake, D.M.; Shunk, E.R. (IEEE transactions on nuclear science, 1991)
Keywords: 440200 - Radiation Effects on Instrument Components, Instruments, or Electronic Systems; ANNEALING; BARYONS; ELEMENTARY PARTICLES; Energy measurement; Exact sciences and technology; FERMIONS; Gamma ray detection; Gamma ray detectors; GE SEMICONDUCTOR DETECTORS; Germanium; HADRONS; HEAT TREATMENTS; HIGH-PURITY GE DETECTORS; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; IRRADIATION; MEASURING INSTRUMENTS; NUCLEONS; Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy; Particle measurements; Physics; PROTONS; RADIATION DETECTORS; RADIATION EFFECTS; RESOLUTION; SEMICONDUCTOR DETECTORS; Shape; SPACE FLIGHT; Space missions; Spacecraft Instrumentation; Temperature; Degradation; Irradiation; Proton; Radiation detector; Experimental study