Interdefect charge exchange in silicon particle detectors at cryogenic temperatures - MacEvoy, B.; Santocchia, A.; Hall, G.; Moscatelli, F.; Passeri, D.; Bilei, G.M. (IEEE transactions on nuclear science, 2002)
Keywords: Bias; Charge exchange; Computer simulation; Cryogenics; Detectors; Doping; Hadrons; Large Hadron Collider; Mathematical models; Predictive models; Pulse measurements; Radiation detectors; Semiconductor process modeling; Silicon; Space charge; Spectra; Temperature