Electron Optics Simulator: A Three-Dimensional Finite-Element Electron Gun and Collector Design Tool

This paper reports the development of a fully 3-D finite-element (FE) design tool for the design of electron guns and collectors called the electron optics simulator (EOS). It is a module of the microwave tube simulator suite (MTSS) developed by the University of Electronic Science and Technology of...

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Published inIEEE transactions on electron devices Vol. 56; no. 1; pp. 140 - 148
Main Authors Huang, Tao, Hu, Quan, Yang, Zhong Hai, Li, Bin, Li, Jian Qing, Jin, Xiao Lin, Hu, Yu Lu, Zhu, Xiao Fang, Liao, Li, Xiao, Li, He, Guo Xian
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.01.2009
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
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ISSN0018-9383
1557-9646
DOI10.1109/TED.2008.2008377

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Abstract This paper reports the development of a fully 3-D finite-element (FE) design tool for the design of electron guns and collectors called the electron optics simulator (EOS). It is a module of the microwave tube simulator suite (MTSS) developed by the University of Electronic Science and Technology of China. EOS specifically targets problem classes including axisymmetric gun, gridded gun, multibeam gun, and multistage depressed collector. EOS is a steady-state trajectory code, which is a solver of electrostatic field and trajectory that takes into account secondary electrons, space-charge effects, and the external magnetic field. The simulator is dependent on the following two front-end features in MTSS: preprocessing that includes a solid modeling tool and a fully 3-D tetrahedral FE mesh automatic generator, and post processing for analysis and display of the results. A friendly interface is provided to design, test, optimize, and validate the electron optics systems. The aforementioned theoretical models are discussed in detail in this paper. In the end, some comparisons between simulation and experiment are presented.
AbstractList This paper reports the development of a fully 3-D finite-element (FE) design tool for the design of electron guns and collectors called the electron optics simulator (EOS). It is a module of the microwave tube simulator suite (MTSS) developed by the University of Electronic Science and Technology of China. EOS specifically targets problem classes including axisymmetric gun, gridded gun, multibeam gun, and multistage depressed collector. EOS is a steady-state trajectory code, which is a solver of electrostatic field and trajectory that takes into account secondary electrons, space-charge effects, and the external magnetic field. The simulator is dependent on the following two front-end features in MTSS: preprocessing that includes a solid modeling tool and a fully 3-D tetrahedral FE mesh automatic generator, and post processing for analysis and display of the results. A friendly interface is provided to design, test, optimize, and validate the electron optics systems. The aforementioned theoretical models are discussed in detail in this paper. In the end, some comparisons between simulation and experiment are presented.
[...] some comparisons between simulation and experiment are presented.
Author Li Xiao
Yu Lu Hu
Zhong Hai Yang
Jian Qing Li
Li Liao
Quan Hu
Xiao Lin Jin
Guo Xian He
Tao Huang
Bin Li
Xiao Fang Zhu
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Cites_doi 10.1109/16.202798
10.1109/TPS.2002.801659
10.1109/TED.2005.845800
10.1109/IEDM.1980.189871
10.1109/TPS.2002.801640
10.1109/16.34278
10.1109/IEDM.1975.188873
10.1109/JQE.1983.1071922
10.1109/16.405282
10.1109/TMAG.2006.890966
10.1109/16.892163
10.1109/IVELEC.2008.4556553
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Issue 1
Keywords 3-D
electron optics simulator (EOS)
multistage depressed collector (MDC)
Electron gun
finite-element method (FEM)
microwave tube simulator suite (MTSS)
External field
Circuit design
Space charge
Electron optics
Numerical method
Modeling
Steady state
Microwave tube
Secondary electron
Finite element method
Three dimensional model
Coding
Collector
Magnetic field
Simulator
Multistage circuit
Computer aided design
Comparative study
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References ref12
(ref6) 2008
ref15
ref14
ref30
ref11
ref1
(ref20) 2007
ref17
(ref28) 2007
cheng (ref23) 1986
ives (ref13) 2003
(ref3) 1992
li (ref19) 2007
true (ref8) 1975
ref24
ref26
ref25
(ref5) 2008
herrmannsfeldt (ref7) 0
dionne (ref10) 1980
(ref29) 2008
huang (ref18) 2007
(ref21) 2007
william (ref22) 2003
trowbridge (ref4) 1991
reimer (ref27) 1985; 45
mankofsky (ref2) 1988; 177
humphries (ref9) 1994
(ref16) 2008
References_xml – year: 1991
  ident: ref4
  publication-title: An Introduction to Computer Aided Electromagnetic Analysis
– start-page: 3560
  year: 2003
  ident: ref13
  article-title: Development of 3D finite element charged particle code with adaptive meshing
  publication-title: Proc Particle Accelerator Conf
– ident: ref26
  doi: 10.1109/16.202798
– year: 2008
  ident: ref6
  publication-title: CST homepage
– year: 2008
  ident: ref16
  publication-title: Vector Fields Homepage
– ident: ref11
  doi: 10.1109/TPS.2002.801659
– volume: 45
  start-page: 135
  year: 1985
  ident: ref27
  publication-title: Scanning Electron Microscopy Physics of Image Formation and Microanalysis ser Springer Ser Opt Science
– ident: ref12
  doi: 10.1109/TED.2005.845800
– year: 2007
  ident: ref20
  publication-title: A User Guide
– year: 2008
  ident: ref5
  publication-title: MAGIC Homepage
– year: 1986
  ident: ref23
  publication-title: Cathode Electronics Shanxi
– start-page: 479
  year: 1980
  ident: ref10
  article-title: three dimensional simulation of gridded twt guns
  publication-title: 1980 International Electron Devices Meeting
  doi: 10.1109/IEDM.1980.189871
– year: 2008
  ident: ref29
  publication-title: Ansoft Homepage
– year: 1992
  ident: ref3
  publication-title: AVGUN Gun Module User's Manual
– ident: ref24
  doi: 10.1109/TPS.2002.801640
– ident: ref25
  doi: 10.1109/16.34278
– year: 2007
  ident: ref28
  publication-title: HOOPS User Guide
– start-page: 257
  year: 1975
  ident: ref8
  article-title: the deformable relaxation mesh technique for solution of electron optics problems
  publication-title: 1975 International Electron Devices Meeting
  doi: 10.1109/IEDM.1975.188873
– volume: 177
  start-page: 137
  year: 1988
  ident: ref2
  article-title: Three-dimensional electromagnetic particle codes and applications to accelerators
  publication-title: Linear Accelerators and Beam Optics Codes
– ident: ref30
  doi: 10.1109/JQE.1983.1071922
– year: 2003
  ident: ref22
  publication-title: Numerical Recipes in C++
– year: 0
  ident: ref7
– start-page: 597
  year: 1994
  ident: ref9
  publication-title: Computational Accelerator Physics
– ident: ref17
  doi: 10.1109/16.405282
– start-page: 383
  year: 2007
  ident: ref19
  article-title: Microwave tube simulator SUITE?Part I: Architecture and feature
  publication-title: Proc IVEC
– ident: ref15
  doi: 10.1109/TMAG.2006.890966
– ident: ref14
  doi: 10.1109/16.892163
– start-page: 385
  year: 2007
  ident: ref18
  article-title: Microwave tube simulator SUITE?Part II: Electron optics simulator
  publication-title: Proc IVEC
– ident: ref1
  doi: 10.1109/IVELEC.2008.4556553
– year: 2007
  ident: ref21
  publication-title: Simmetrix User Guide
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Snippet This paper reports the development of a fully 3-D finite-element (FE) design tool for the design of electron guns and collectors called the electron optics...
[...] some comparisons between simulation and experiment are presented.
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SubjectTerms 3-D
Accumulators
Applied sciences
Collectors
Computational modeling
Computer simulation
Design engineering
Earth Observing System
Electron gun
Electron optics
electron optics simulator (EOS)
Electronic tubes, masers
Electronics
Electrostatics
Exact sciences and technology
Finite element method
finite-element method (FEM)
Integrated circuit modeling
microwave tube simulator suite (MTSS)
multistage depressed collector (MDC)
Object oriented modeling
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Simulation
Solid modeling
Studies
Trajectory
Vacuum microelectronics
Title Electron Optics Simulator: A Three-Dimensional Finite-Element Electron Gun and Collector Design Tool
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