Confalonieri, F., Cocchetti, G., Ghisi, A., & Corigliano, A. (2013). A domain decomposition method for the simulation of fracture in polysilicon MEMS. Microelectronics and reliability, 53(8), 1045-1054. https://doi.org/10.1016/j.microrel.2013.02.021
Chicago Style (17th ed.) CitationConfalonieri, Federica, Giuseppe Cocchetti, Aldo Ghisi, and Alberto Corigliano. "A Domain Decomposition Method for the Simulation of Fracture in Polysilicon MEMS." Microelectronics and Reliability 53, no. 8 (2013): 1045-1054. https://doi.org/10.1016/j.microrel.2013.02.021.
MLA (9th ed.) CitationConfalonieri, Federica, et al. "A Domain Decomposition Method for the Simulation of Fracture in Polysilicon MEMS." Microelectronics and Reliability, vol. 53, no. 8, 2013, pp. 1045-1054, https://doi.org/10.1016/j.microrel.2013.02.021.