Yao, L., Zhao, B., Wang, X., Mei, S., & Chi, Y. (2024). A Detection Algorithm for Surface Defects of Printed Circuit Board Based on Improved YOLOv8. IEEE access, 12, 170227-170242. https://doi.org/10.1109/ACCESS.2024.3498004
Chicago Style (17th ed.) CitationYao, Lei, Bing Zhao, Xihui Wang, Sihan Mei, and Yulun Chi. "A Detection Algorithm for Surface Defects of Printed Circuit Board Based on Improved YOLOv8." IEEE Access 12 (2024): 170227-170242. https://doi.org/10.1109/ACCESS.2024.3498004.
MLA (9th ed.) CitationYao, Lei, et al. "A Detection Algorithm for Surface Defects of Printed Circuit Board Based on Improved YOLOv8." IEEE Access, vol. 12, 2024, pp. 170227-170242, https://doi.org/10.1109/ACCESS.2024.3498004.
Warning: These citations may not always be 100% accurate.