APA (7th ed.) Citation

Liu, P., You, Z., Kuang, J., Hu, Z., Duan, H., & Wang, W. (2016). Efficient March test algorithm for 1T1R cross-bar with complete fault coverage. Electronics letters, 52(18), 1520-1522. https://doi.org/10.1049/el.2016.1693

Chicago Style (17th ed.) Citation

Liu, Peng, Zhiqiang You, Jishun Kuang, Zhipeng Hu, Heng Duan, and Weizheng Wang. "Efficient March Test Algorithm for 1T1R Cross-bar with Complete Fault Coverage." Electronics Letters 52, no. 18 (2016): 1520-1522. https://doi.org/10.1049/el.2016.1693.

MLA (9th ed.) Citation

Liu, Peng, et al. "Efficient March Test Algorithm for 1T1R Cross-bar with Complete Fault Coverage." Electronics Letters, vol. 52, no. 18, 2016, pp. 1520-1522, https://doi.org/10.1049/el.2016.1693.