APA (7th ed.) Citation

Kim, D., Lee, J., Seo, Y., Kwon, O., Masouleh, P. A., Lee, J., . . . Hwang, H. (2025). Boosting Stochasticity in Ovonic Threshold Switches Through Cryogenic First Firing for Fast and Reliable Entropy Generation. Advanced electronic materials, 11(9), -n/a. https://doi.org/10.1002/aelm.202400881

Chicago Style (17th ed.) Citation

Kim, Dongmin, Jangseop Lee, Yoori Seo, Ohhyuk Kwon, Pendar Azaripour Masouleh, Jisung Lee, Joonhyun Kwon, Chul‐Heung Kim, and Hyunsang Hwang. "Boosting Stochasticity in Ovonic Threshold Switches Through Cryogenic First Firing for Fast and Reliable Entropy Generation." Advanced Electronic Materials 11, no. 9 (2025): -n/a. https://doi.org/10.1002/aelm.202400881.

MLA (9th ed.) Citation

Kim, Dongmin, et al. "Boosting Stochasticity in Ovonic Threshold Switches Through Cryogenic First Firing for Fast and Reliable Entropy Generation." Advanced Electronic Materials, vol. 11, no. 9, 2025, pp. -n/a, https://doi.org/10.1002/aelm.202400881.