Test sequencing for sequential system diagnosis with precedence constraints and imperfect tests

We study sequential system testing with the objective of minimizing the total expected testing costs. The goal is to discover the state of a system that consists of a set of independent components. The state of the system depends on the states of the individual components and is classified as workin...

Full description

Saved in:
Bibliographic Details
Published inDecision Support Systems Vol. 103; pp. 104 - 116
Main Authors Wei, Wenchao, Li, Hongbo, Leus, Roel
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.11.2017
Elsevier Sequoia S.A
Subjects
Online AccessGet full text
ISSN0167-9236
1873-5797
DOI10.1016/j.dss.2017.09.009

Cover

More Information
Summary:We study sequential system testing with the objective of minimizing the total expected testing costs. The goal is to discover the state of a system that consists of a set of independent components. The state of the system depends on the states of the individual components and is classified as working if at least a pre-specified number of components are working, otherwise it is said to be down. During the diagnostic testing procedure, components are tested one by one, in a pre-specified order. The resulting test sequencing problem is NP-hard with general precedence constraints even when the tests are perfect, in which case a component test always reports the correct state of the component. In this work, we will also consider the additional complication that tests can be imperfect, meaning that a test can report a component to be working when it is actually down, and vice versa. We develop a tabu search algorithm together with a simulation-based evaluation technique that incorporates importance sampling to find high-quality solutions within limited runtimes. •We study sequential system testing to minimize expected testing costs.•We examine the generalization where tests can be imperfect.•We develop a tabu search algorithm.•We incorporate simulation with importance sampling.•We find high-quality solutions within limited runtimes.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ISSN:0167-9236
1873-5797
DOI:10.1016/j.dss.2017.09.009