Facile Morphological Qualification of Transferred Graphene by Phase‐Shifting Interferometry - Lee, Ukjae; Woo, Yun Sung; Han, Yoojoong; Gutiérrez, Humberto R.; Kim, Un Jeong; Son, Hyungbin (Advanced materials (Weinheim), 2020)
Keywords: Adhesive strength; Atomic beam spectroscopy; Atomic force microscopy; Chemical vapor deposition; Circuits; Evaluation; Graphene; Interferometry; Materials science; Microscopy; Morphology; Nanomaterials; phase‐shifting interferometry; Quality control; Raman spectroscopy; Refractivity; residues; Spectrum analysis; Substrates; Surface roughness; Thickness; transfer; phase-shifting interferometry; transfer; chemical vapor deposition; graphene; residues