Exponential-type error probabilities for multiterminal hypothesis testing
Multiterminal hypothesis testing is considered, subject to the exponential-type constraint alpha /sub n/<or=exp(-nr) on the error probability of the first kind. The problem is to determine the minimum beta */sub n/ of the error probability of the second kind under the given constraint at limited...
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          | Published in | IEEE transactions on information theory Vol. 35; no. 1; pp. 2 - 14 | 
|---|---|
| Main Authors | , | 
| Format | Journal Article | 
| Language | English | 
| Published | 
        New York, NY
          IEEE
    
        01.01.1989
     Institute of Electrical and Electronics Engineers  | 
| Subjects | |
| Online Access | Get full text | 
| ISSN | 0018-9448 | 
| DOI | 10.1109/18.42171 | 
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| Abstract | Multiterminal hypothesis testing is considered, subject to the exponential-type constraint alpha /sub n/<or=exp(-nr) on the error probability of the first kind. The problem is to determine the minimum beta */sub n/ of the error probability of the second kind under the given constraint at limited rates R/sub 1/ and R/sub 2/ for observing the respective pairs of variables. Good lower bounds on the power exponent for beta */sub n/ are presented by invoking basic properties of r-divergent sequences. In particular, the one-bit and the zero-rate compression cases are considered. The power exponent for the former and a lower bound for the latter are established.< > | 
    
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| AbstractList | Multiterminal hypothesis testing is considered, subject to the exponential-type constraint alpha /sub n/<or=exp(-nr) on the error probability of the first kind. The problem is to determine the minimum beta */sub n/ of the error probability of the second kind under the given constraint at limited rates R/sub 1/ and R/sub 2/ for observing the respective pairs of variables. Good lower bounds on the power exponent for beta */sub n/ are presented by invoking basic properties of r-divergent sequences. In particular, the one-bit and the zero-rate compression cases are considered. The power exponent for the former and a lower bound for the latter are established.< > Multiterminal hypothesis testing is considered, subject to the exponential-type constraint alpha(n) exp(- < e1 > nr < /e1 > ) on the error probability of the first kind. The problem is to determine the minimum beta*(n) of the error probability of the second kind under the given constraint at limited rates < e1 > R < /e1 > (1) and < e1 > R < /e1 > (2) for observing the respective pairs of variables. Good lower bounds on the power exponent for beta*(n) are presented by invoking basic properties of < e1 > r < /e1 > -divergent sequences. In particular, the one-bit and the zero-rate compression cases are considered. The power exponent for the former and a lower bound for the latter are established  | 
    
| Author | Kobayashi, K. Han, T.S.  | 
    
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| Cites_doi | 10.1109/18.42188 10.1214/aoms/1177700150 10.1109/TIT.1986.1057194 10.1109/TIT.1974.1055254 10.1109/18.32118 10.1109/TIT.1982.1056497 10.1109/18.2629 10.1109/TIT.1980.1056192 10.1109/TIT.1975.1055356 10.1109/TIT.1987.1057383 10.1137/0128010  | 
    
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| References | ref13 ref14 ref11 amari (ref7) 1986; j69 a ref2 ref1 ref17 berger (ref12) 1977 ref16 (ref9) 0 berger (ref3) 1979 ref8 csisz r (ref15) 1967; 2 ref4 csisz r (ref10) 1981 ref6 ref5  | 
    
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| Snippet | Multiterminal hypothesis testing is considered, subject to the exponential-type constraint alpha /sub n/<or=exp(-nr) on the error probability of the first... Multiterminal hypothesis testing is considered, subject to the exponential-type constraint alpha(n) exp(- < e1 > nr < /e1 > ) on the error probability of the...  | 
    
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| SubjectTerms | Applied sciences Decoding Error probability Exact sciences and technology Information systems Information theory Information, signal and communications theory Mathematics Performance evaluation Statistical analysis System testing Telecommunications and information theory  | 
    
| Title | Exponential-type error probabilities for multiterminal hypothesis testing | 
    
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