Exponential-type error probabilities for multiterminal hypothesis testing

Multiterminal hypothesis testing is considered, subject to the exponential-type constraint alpha /sub n/<or=exp(-nr) on the error probability of the first kind. The problem is to determine the minimum beta */sub n/ of the error probability of the second kind under the given constraint at limited...

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Bibliographic Details
Published inIEEE transactions on information theory Vol. 35; no. 1; pp. 2 - 14
Main Authors Han, T.S., Kobayashi, K.
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.01.1989
Institute of Electrical and Electronics Engineers
Subjects
Applied sciences
Decoding
Error probability
Exact sciences and technology
Information systems
Information theory
Information, signal and communications theory
Mathematics
Performance evaluation
Statistical analysis
System testing
Telecommunications and information theory
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ISSN0018-9448
DOI10.1109/18.42171

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Summary:Multiterminal hypothesis testing is considered, subject to the exponential-type constraint alpha /sub n/<or=exp(-nr) on the error probability of the first kind. The problem is to determine the minimum beta */sub n/ of the error probability of the second kind under the given constraint at limited rates R/sub 1/ and R/sub 2/ for observing the respective pairs of variables. Good lower bounds on the power exponent for beta */sub n/ are presented by invoking basic properties of r-divergent sequences. In particular, the one-bit and the zero-rate compression cases are considered. The power exponent for the former and a lower bound for the latter are established.< >
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ISSN:0018-9448
DOI:10.1109/18.42171