Theory of transparent BIST for RAMs - Nicolaidis, M. (IEEE transactions on computers, 1996)
Keywords: Algorithm design and analysis; Algorithmics. Computability. Computer arithmetics; Applied sciences; Built-in self-test; Circuit faults; Circuit testing; Compaction; Computer science; control theory; systems; Electronics; Engineering Sciences; Exact sciences and technology; Fault detection; Handwriting recognition; Integrated circuits; Integrated circuits by function (including memories and processors); Manufacturing; Memory and file management (including protection and security); Memory organisation. Data processing; Micro and nanotechnologies; Microelectronics; Performance evaluation; Read-write memory; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Software; Theoretical computing; Direct access; Storage management; Algorithm complexity; Random access storage; Signature analysis; Failures; Modeling; Addressing; transparent-test-algorithms; fault-coverage; RAM-test-algorithm; modeled-faults; fabrication-testing; periodic-testing; aliasing; transparent-BIST